A statistical method for the analysis of quantitative thin-film X-ray microanalytical data

Area of Science:

• Materials Science
• Analytical Chemistry
• Geochemistry

Background:

• Accurate statistical characterization of thin-film X-ray microanalytical data is crucial for reliable scientific interpretation.
• Existing methods may lack comprehensive statistical frameworks for evaluating such data.

Purpose of the Study:

• To present a series of statistical equations for characterizing thin-film X-ray microanalytical data.
• To introduce test statistics based on the Gaussian distribution for data analysis.
• To demonstrate the application and evaluation of an empirically derived magnesium/calcium (Mg/Ca) working curve.

Main Methods:

• Development of statistical equations for thin-film X-ray microanalysis.
• Application of Gaussian distribution-based test statistics.
• Empirical derivation and validation of a Mg/Ca working curve.

Main Results:

• A robust statistical framework for analyzing thin-film X-ray microanalytical data was established.
• Gaussian test statistics provide a reliable method for data evaluation.
• The empirically derived Mg/Ca working curve demonstrated effective use and evaluation.

Conclusions:

• The presented statistical methods enhance the reliability and accuracy of thin-film X-ray microanalysis.
• Gaussian statistics offer a powerful tool for assessing data quality.
• The Mg/Ca working curve serves as a practical standard for specific elemental analysis.