Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Videos

Optical and digital image processing in high-resolution electron microscopy

R E Burge, J C Dainty, R F Scott

    Ultramicroscopy
    |April 1, 1977
    PubMed
    Summary
    This summary is machine-generated.

    Related Concept Videos

    You might also read

    Related Articles

    Articles linked to this work by shared authors, journal, and citation graph.

    Sort by
    Same author

    Dual Coaxial Longitudinal Polarization Vortex Structures.

    Physical review letters·2020
    Same author

    Fast vectorial calculation of the volumetric focused field distribution by using a three-dimensional Fourier transform.

    Optics express·2012
    Same author

    Ambiguity of optical coherence tomography measurements due to rough surface scattering.

    Optics express·2011
    Same author

    Direct calculation of a three-dimensional diffracted field.

    Optics letters·2011
    Same author

    X-Ray Microscopy at Suboptical Resolution: Direct Observation of the 65-nm Periodicity in Collagen Fibrils.

    Journal of X-ray science and technology·2011
    Same author

    Measurements of the four-point coherence function by the use of the coherence enhancement phenomenon.

    Applied optics·2010
    Same journal

    Efficient methods for wave propagation in electron microscopy.

    Ultramicroscopy·2026
    Same journal

    Unsupervised deep image prior for sparse-view and limited-angle electron tomography.

    Ultramicroscopy·2026
    Same journal

    Determination of the structure of the tertiary phase in the alloy Al<sub>10</sub>Mo<sub>10</sub>Nb<sub>10</sub>Ta<sub>10</sub>Ti<sub>30</sub>Zr<sub>30</sub> using convergent beam electron diffraction.

    Ultramicroscopy·2026
    Same journal

    Predictive drift compensation of multi-frame STEM via live scan modification.

    Ultramicroscopy·2026
    Same journal

    Deep PACBED: Multitask analysis of PACBED images using deep neural networks.

    Ultramicroscopy·2026
    Same journal

    Guided progressive reconstructive imaging: A new quantization-based framework for low-dose, high-throughput and real-time analytical ptychography.

    Ultramicroscopy·2026
    See all related articles

    Digital and optical processing effectively deblur electron microscopy images of ferritin particles. Both methods yield similar results, offering practical advantages for image analysis.

    Area of Science:

    • Electron Microscopy
    • Image Processing
    • Materials Science

    Background:

    • Deblurring is crucial for enhancing resolution in electron microscopy.
    • Ferritin particles on carbon films are a standard test sample.
    • Understanding image degradation factors is essential.

    Purpose of the Study:

    • To compare digital and optical deblurring techniques for electron microscopy images.
    • To analyze the impact of electron beam coherence and objective lens on deblurring.
    • To evaluate Weiner signal-to-noise optimization in deblurring.

    Main Methods:

    • Single conventional bright-field electron imaging of ferritin particles.
    • Digital image processing for deblurring.
    • Optical processing for deblurring.

    Related Experiment Videos

  • Incorporation of electron beam coherence and phase contrast transfer function effects.
  • Application of Weiner signal-to-noise optimization.

    • Main Results:

    • Digital and optical processing achieved comparable deblurring results.
    • The deblurring functions effectively accounted for imaging parameters.
    • Practical considerations for both methods were analyzed.

    Conclusions:

    • Both digital and optical deblurring are viable for electron microscopy.
    • The choice of method depends on practical aspects and desired outcomes.
    • Further analysis of computer-aided image processing modes is provided.