Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Videos

ASIC-based event-driven 2D digital electron counter for TEM imaging

G Y Fan, P Datte, E Beuville

    Ultramicroscopy
    |March 21, 1998
    PubMed
    Summary
    This summary is machine-generated.

    Related Concept Videos

    You might also read

    Related Articles

    Articles linked to this work by shared authors, journal, and citation graph.

    Sort by
    Same author

    Daily ultrastructural remodeling of clock neurons.

    bioRxiv : the preprint server for biology·2025
    Same author

    Achievement of Target Gain Larger than Unity in an Inertial Fusion Experiment.

    Physical review letters·2024
    Same author

    Lawson Criterion for Ignition Exceeded in an Inertial Fusion Experiment.

    Physical review letters·2022
    Same author

    The Scattered Light Time-history Diagnostic suite at the National Ignition Facility.

    The Review of scientific instruments·2021
    Same author

    The design of a line velocity interferometer for any reflector for inertial confinement experiments on the Z-machine.

    The Review of scientific instruments·2020
    Same author

    High-performance serial block-face SEM of nonconductive biological samples enabled by focal gas injection-based charge compensation.

    Journal of microscopy·2017
    Same journal

    Predictive drift compensation of multi-frame STEM via live scan modification.

    Ultramicroscopy·2026
    Same journal

    Deep PACBED: Multitask analysis of PACBED images using deep neural networks.

    Ultramicroscopy·2026
    Same journal

    Guided progressive reconstructive imaging: A new quantization-based framework for low-dose, high-throughput and real-time analytical ptychography.

    Ultramicroscopy·2026
    Same journal

    Brightness optimization in a 200 keV DTEM source by geometry-driven aberration suppression.

    Ultramicroscopy·2026
    Same journal

    Characterization of the Timepix4 hybrid pixel detector and its impact on four-dimensional scanning transmission electron microscopy (4D-STEM).

    Ultramicroscopy·2026
    Same journal

    Contamination analysis of the residual gas composition in transmission electron microscopy.

    Ultramicroscopy·2026
    See all related articles

    A novel application-specific integrated circuit (ASIC) detector, originally for X-ray crystallography, shows promise as a direct electron detector for transmission electron microscopy (TEM). Its unique features enable low-dose imaging and real-time diffraction analysis.

    Area of Science:

    • Materials Science
    • Physics
    • Biophysics

    Background:

    • Traditional charge-coupled device (CCD) detectors in transmission electron microscopy (TEM) often require scintillator screens and are limited by noise and readout speed.
    • Application-specific integrated circuit (ASIC) detectors, developed for X-ray protein crystallography, offer unique properties for direct electron detection.

    Discussion:

    • This study evaluates an ASIC detector's performance for TEM imaging across a 20-400 keV voltage range.
    • Key advantages include direct electron bombardment capability (no scintillator needed), independent pixel electron counting, frameless event-driven readout, room temperature operation, and near-zero noise.
    • The detector boasts a virtually unlimited counting dynamic range.

    Key Insights:

    • The ASIC detector functions as an electron counter at each pixel, providing independent digital output.

    Related Experiment Videos

  • Its frameless, event-driven readout and room temperature operation minimize noise and enhance efficiency.
  • The device's wide dynamic range and direct electron sensitivity are significant improvements over CCDs.

    • Outlook:

    • ASIC-based detectors are ideal for low-dose TEM imaging, enabling real-time diffraction observation and recording.
    • This technology offers advantages for conventional TEM imaging, providing direct digital readout benefits.
    • Further integration of ASIC detectors could revolutionize various TEM applications requiring high sensitivity and dynamic range.