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Applied Optics|March 18, 2008
Improved vertical-scanning interferometryA Harasaki, J Schmit, J C Wyant
Applied Optics|March 22, 2008
Offset of coherent envelope position due to phase change on reflectionA Harasaki, J Schmit, J C Wyant
Applied Optics|March 18, 2008
Fringe modulation skewing effect in white-light vertical scanning interferometryA Harasaki, J C Wyant
Applied Optics|January 30, 2010
Testing aspherics using two-wavelength holographyJ C Wyant
Science (New York, N.Y.)|October 12, 1979
Precision optical testingJ C Wyant
Applied Optics|February 16, 2010
OTF measurements with a white light source: an interferometric techniqueJ C Wyant
Applied Optics|February 16, 2010
Use of an ac heterodyne lateral shear interferometer with real-time wavefront correction systemsJ C Wyant
Optics Letters|August 15, 2009
Image blur for rainbow hologramsJ C Wyant
Applied Optics|February 4, 2010
White light extended source shearing interferometerJ C Wyant
Applied Optics|February 4, 2010
Double frequency grating lateral shear interferometerJ C Wyant
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