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Microscopy Research and Technique|May 18, 2000
Characterisation of the signal and noise transfer of CCD cameras for electron detectionR R Meyer, A I KirklandJournal of Microscopy|May 10, 2002
Cation segregation in Nb16W18O94 using high angle annular dark field scanning transmission electron microscopy and image processingA I Kirkland, W O SaxtonUltramicroscopy|January 25, 2007
Ultrahigh resolution imaging of local structural distortions in intergrowth tungsten bronzesA I Kirkland, J Sloan, S HaighUltramicroscopy|November 29, 2005
On the importance of fifth-order spherical aberration for a fully corrected electron microscopeL Y Chang, A I Kirkland, J M TitchmarshUltramicroscopy|April 20, 2004
A new method for the determination of the wave aberration function for high-resolution TEM.; 2. Measurement of the antisymmetric aberrationsR R Meyer, A I Kirkland, W O SaxtonUltramicroscopy|July 26, 2002
A new method for the determination of the wave aberration function for high resolution TEM 1. Measurement of the symmetric aberrationsR R Meyer, A I Kirkland, W O SaxtonUltramicroscopy|July 6, 2005
Calculations of HREM image intensity using Monte Carlo integrationL Y Chang, R R Meyer, A I KirklandMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 22, 2007
Imaging modes for scanning confocal electron microscopy in a double aberration-corrected transmission electron microscopeP D Nellist, E C Cosgriff, G Behan, et al.Ultramicroscopy|March 30, 2004
Resolution extension and exit wave reconstruction in complex HREMWen-Kuo Hsieh, Fu-Rong Chen, Ji-Jung Kai, et al.Ultramicroscopy|June 12, 2013
Recording low and high spatial frequencies in exit wave reconstructionsS J Haigh, B Jiang, D Alloyeau, et al.Pageof 3