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Journal of Microscopy|February 3, 2016
Rapid aberration measurement with pixelated detectorsA R Lupini, M Chi, S Jesse
Scientific Reports|May 24, 2016
Big Data Analytics for Scanning Transmission Electron Microscopy PtychographyS Jesse, M Chi, A Belianinov, et al.
Ultramicroscopy|July 23, 2003
Localization in elastic and inelastic scatteringA R Lupini, S J Pennycook
Ultramicroscopy|September 15, 2009
Spectroscopic imaging of electron energy loss spectra using ab initio data and function field visualizationP Rulis, A R Lupini, S J Pennycook, et al.
Ultramicroscopy|May 4, 2010
Aberration measurement using the Ronchigram contrast transfer functionA R Lupini, P Wang, P D Nellist, et al.
Journal of Electron Microscopy|July 27, 2001
Progress in aberration-corrected scanning transmission electron microscopyN Dellby, O L Krivanek, P D Nellist, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 17, 2009
Characterizing the two- and three-dimensional resolution of an improved aberration-corrected STEMA R Lupini, A Y Borisevich, J C Idrobo, et al.
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