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A Wucher

Showing results (1-10 of 11) with videos related to

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Physical Review Letters|November 5, 2004
Kinetic electron excitation in atomic collision cascadesS Meyer, D Diesing, A Wucher
Surface and Interface Analysis : SIA|December 19, 2013
Fundamental studies of molecular depth profiling using organic delta layers as model systemsC Lu, A Wucher, N Winograd
Surface and Interface Analysis : SIA|December 19, 2013
Ionization effects in molecular depth profiling of trehalose films using buckminsterfullerene (C<sub>60</sub>) cluster ionsC Lu, A Wucher, N Winograd
Analytical and Bioanalytical Chemistry|January 21, 2009
Three-dimensional depth profiling of molecular structuresA Wucher, J Cheng, L Zheng, et al.
Analytical and Bioanalytical Chemistry|October 1, 1995
Relative elemental sensitivity factors in non-resonant laser-SNMSM Wahl, D Koch, W Berthold, et al.
Surface and Interface Analysis : SIA|August 14, 2015
Investigating the Fundamentals of Molecular Depth Profiling Using Strong-field Photoionization of Sputtered NeutralsD Willingham, D A Brenes, N Winograd, et al.
The Journal of Physical Chemistry. C, Nanomaterials and Interfaces|May 25, 2010
Strong-field Photoionization of Sputtered Neutral Molecules for Molecular Depth ProfilingD Willingham, D A Brenes, A Wucher, et al.
Rapid Communications in Mass Spectrometry : RCM|October 17, 1998
Vacuum ultraviolet single photon versus femtosecond multiphoton ionization of sputtered germanium clustersA Wucher, R Heinrich, R M Braun, et al.
Lancet (London, England)|July 6, 1991
Assessment of the mitochondrial respiratory chainP Rustin, D Chretien, T Bourgeron, et al.
The Review of Scientific Instruments|February 1, 2016
A new setup for the investigation of swift heavy ion induced particle emission and surface modificationsF Meinerzhagen, L Breuer, H Bukowska, et al.
Pageof 2

Showing results (1-10 of 11) with videos related to

Sort By:
Pageof 2
Physical Review Letters|November 5, 2004
Kinetic electron excitation in atomic collision cascadesS Meyer, D Diesing, A Wucher
Surface and Interface Analysis : SIA|December 19, 2013
Fundamental studies of molecular depth profiling using organic delta layers as model systemsC Lu, A Wucher, N Winograd
Surface and Interface Analysis : SIA|December 19, 2013
Ionization effects in molecular depth profiling of trehalose films using buckminsterfullerene (C<sub>60</sub>) cluster ionsC Lu, A Wucher, N Winograd
Analytical and Bioanalytical Chemistry|January 21, 2009
Three-dimensional depth profiling of molecular structuresA Wucher, J Cheng, L Zheng, et al.
Analytical and Bioanalytical Chemistry|October 1, 1995
Relative elemental sensitivity factors in non-resonant laser-SNMSM Wahl, D Koch, W Berthold, et al.
Surface and Interface Analysis : SIA|August 14, 2015
Investigating the Fundamentals of Molecular Depth Profiling Using Strong-field Photoionization of Sputtered NeutralsD Willingham, D A Brenes, N Winograd, et al.
The Journal of Physical Chemistry. C, Nanomaterials and Interfaces|May 25, 2010
Strong-field Photoionization of Sputtered Neutral Molecules for Molecular Depth ProfilingD Willingham, D A Brenes, A Wucher, et al.
Rapid Communications in Mass Spectrometry : RCM|October 17, 1998
Vacuum ultraviolet single photon versus femtosecond multiphoton ionization of sputtered germanium clustersA Wucher, R Heinrich, R M Braun, et al.
Lancet (London, England)|July 6, 1991
Assessment of the mitochondrial respiratory chainP Rustin, D Chretien, T Bourgeron, et al.
The Review of Scientific Instruments|February 1, 2016
A new setup for the investigation of swift heavy ion induced particle emission and surface modificationsF Meinerzhagen, L Breuer, H Bukowska, et al.
Pageof 2