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Ultramicroscopy|August 24, 2016
Surface topography analysis with application of roughness area dependence methodAdam Szyszka, Mateusz Wośko, Tomasz Szymański, et al.
Nanomaterials (Basel, Switzerland)|July 25, 2025
Photo-Scanning Capacitance Microscopy and Spectroscopy Study of Epitaxial GaAsN Layers and GaAsN P-I-N Solar Cell StructuresAdam Szyszka, Wojciech Dawidowski, Damian Radziewicz, et al.
Sensors (Basel, Switzerland)|January 17, 2020
Enzymatic Platforms for Sensitive Neurotransmitter DetectionSylwia Baluta, Dorota Zając, Adam Szyszka, et al.
Nanomaterials (Basel, Switzerland)|December 10, 2025
Thermal Stability of Thin Metal Films on GaN Surfaces: Morphology and NanostructuringAndrzej Stafiniak, Wojciech Macherzyński, Adam Szyszka, et al.
European Journal of Cancer (Oxford, England : 1990)|September 4, 2024
Retrospective comparative analysis of two medical evacuation systems for Ukrainian patients affected by warAlexandra Mueller, Marta Salek, Aleksandra Oszer, et al.
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