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Adeline Grenier

Showing results (1-10 of 12) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 9, 2016
Preparation and Analysis of Atom Probe Tips by Xenon Focused Ion Beam MillingRobert Estivill, Guillaume Audoit, Jean-Paul Barnes, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 8, 2017
Atomic Scale Structural Characterization of Epitaxial (Cd,Cr)Te Magnetic SemiconductorBastien Bonef, Hervé Boukari, Adeline Grenier, et al.
Ultramicroscopy|July 3, 2017
Toward an accurate quantification in atom probe tomography reconstruction by correlative electron tomography approach on nanoporous materialsIsabelle Mouton, Tony Printemps, Adeline Grenier, et al.
Ultramicroscopy|December 16, 2014
Quantitative investigation of SiGeC layers using atom probe tomographyRobert Estivill, Adeline Grenier, Sébastien Duguay, et al.
Ultramicroscopy|March 28, 2015
Quantitative analysis of Si/SiGeC superlattices using atom probe tomographyRobert Estivill, Adeline Grenier, Sébastien Duguay, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 25, 2023
The Photonic Atom Probe as a Tool for the Analysis of the Effect of Defects on the Luminescence of Nitride Quantum StructuresIoanna Dimkou, Jonathan Houard, Névine Rochat, et al.
Ultramicroscopy|September 29, 2015
Self-adapting denoising, alignment and reconstruction in electron tomography in materials scienceTony Printemps, Guido Mula, Daniele Sette, et al.
Nanotechnology|October 3, 2019
Correlative investigation of Mg doping in GaN layers grown at different temperatures by atom probe tomography and off-axis electron holographyLynda Amichi, Isabelle Mouton, Victor Boureau, et al.
Nanoscale Research Letters|October 21, 2016
Composition Analysis of III-Nitrides at the Nanometer Scale: Comparison of Energy Dispersive X-ray Spectroscopy and Atom Probe TomographyBastien Bonef, Miguel Lopez-Haro, Lynda Amichi, et al.
ACS Nano|April 23, 2024
Effect of Extended Defects on AlGaN Quantum Dots for Electron-Pumped Ultraviolet EmittersJesus Cañas, Nevine Rochat, Adeline Grenier, et al.
Pageof 2

Showing results (1-10 of 12) with videos related to

Sort By:
Pageof 2
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 9, 2016
Preparation and Analysis of Atom Probe Tips by Xenon Focused Ion Beam MillingRobert Estivill, Guillaume Audoit, Jean-Paul Barnes, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 8, 2017
Atomic Scale Structural Characterization of Epitaxial (Cd,Cr)Te Magnetic SemiconductorBastien Bonef, Hervé Boukari, Adeline Grenier, et al.
Ultramicroscopy|July 3, 2017
Toward an accurate quantification in atom probe tomography reconstruction by correlative electron tomography approach on nanoporous materialsIsabelle Mouton, Tony Printemps, Adeline Grenier, et al.
Ultramicroscopy|December 16, 2014
Quantitative investigation of SiGeC layers using atom probe tomographyRobert Estivill, Adeline Grenier, Sébastien Duguay, et al.
Ultramicroscopy|March 28, 2015
Quantitative analysis of Si/SiGeC superlattices using atom probe tomographyRobert Estivill, Adeline Grenier, Sébastien Duguay, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 25, 2023
The Photonic Atom Probe as a Tool for the Analysis of the Effect of Defects on the Luminescence of Nitride Quantum StructuresIoanna Dimkou, Jonathan Houard, Névine Rochat, et al.
Ultramicroscopy|September 29, 2015
Self-adapting denoising, alignment and reconstruction in electron tomography in materials scienceTony Printemps, Guido Mula, Daniele Sette, et al.
Nanotechnology|October 3, 2019
Correlative investigation of Mg doping in GaN layers grown at different temperatures by atom probe tomography and off-axis electron holographyLynda Amichi, Isabelle Mouton, Victor Boureau, et al.
Nanoscale Research Letters|October 21, 2016
Composition Analysis of III-Nitrides at the Nanometer Scale: Comparison of Energy Dispersive X-ray Spectroscopy and Atom Probe TomographyBastien Bonef, Miguel Lopez-Haro, Lynda Amichi, et al.
ACS Nano|April 23, 2024
Effect of Extended Defects on AlGaN Quantum Dots for Electron-Pumped Ultraviolet EmittersJesus Cañas, Nevine Rochat, Adeline Grenier, et al.
Pageof 2