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The Journal of Physical Chemistry Letters|August 12, 2015
Understanding the Dual Nature of the Filament Dissolution in Conductive Bridging DevicesUmberto Celano, Ludovic Goux, Attilio Belmonte, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 6, 2024
Influence of the Emitter Shape on the Field-of-View in Atom Probe TomographyMasoud Dialameh, Yu-Ting Ling, Janusz Bogdanowicz, et al.
Nanoscale|April 5, 2018
Non-destructive characterization of extended crystalline defects in confined semiconductor device structuresAndreas Schulze, Libor Strakos, Tomas Vystavel, et al.
Ultramicroscopy|July 28, 2019
Atom probe of GaN/AlGaN heterostructures: The role of electric field, sample crystallography and laser excitation on quantificationRichard J H Morris, Ramya Cuduvally, Davit Melkonyan, et al.
Scientific Reports|October 22, 2022
Quantification of area-selective deposition on nanometer-scale patterns using Rutherford backscattering spectrometryNiels Claessens, Zamran Zahoor Khan, Negin Rahnemai Haghighi, et al.
Nanoscale|October 2, 2013
Switching mechanism and reverse engineering of low-power Cu-based resistive switching devicesUmberto Celano, Ludovic Goux, Karl Opsomer, et al.
Analytical Chemistry|July 16, 2020
A Correlative ToF-SIMS/SPM Methodology for Probing 3D DevicesValentina Spampinato, Masoud Dialameh, Alexis Franquet, et al.
Nano Letters|November 3, 2015
Imaging the Three-Dimensional Conductive Channel in Filamentary-Based Oxide Resistive Switching MemoryUmberto Celano, Ludovic Goux, Robin Degraeve, et al.
Ultramicroscopy|January 10, 2020
Potential sources of compositional inaccuracy in the atom probe tomography of In<sub>x</sub>Ga<sub>1-x</sub>AsRamya Cuduvally, Richard J H Morris, Piero Ferrari, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 28, 2022
A Bottom-Up Volume Reconstruction Method for Atom Probe TomographyYu-Ting Ling, Siegfried Cools, Janusz Bogdanowicz, et al.
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