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Japanese Journal of Applied Physics (2008)|July 6, 2019
The role of Si in GaN/AlN/Si(111) plasma assisted molecular beam epitaxy: polarity and inversionAlexana Roshko, Matthew Brubaker, Paul Blanchard, et al.
Crystals|October 26, 2020
Selective Area Growth and Structural Characterization of GaN Nanostructures on Si(111) SubstratesAlexana Roshko, Matt Brubaker, Paul Blanchard, et al.
Physica Status Solidi. B, Basic Solid State Physics : PSS|December 18, 2020
Eutectic Formation, V/III Ratio and Controlled Polarity Inversion in Nitrides on Silicon[1]Alexana Roshko, Matt D Brubaker, Paul T Blanchard, et al.
Crystals|January 15, 2025
Characterization of Sub-Monolayer Contaminants at the Regrowth Interface in GaN Nanowires Grown by Selective-Area Molecular Beam EpitaxyPaul Blanchard, Matt Brubaker, Todd Harvey, et al.
Chemistry of Materials : a Publication of the American Chemical Society|May 17, 2019
Electron Enhanced Growth of Crystalline Gallium Nitride Thin Films at Room Temperature and 100 °C Using Sequential Surface ReactionsJaclyn K Sprenger, Andrew S Cavanagh, Huaxing Sun, et al.
The Journal of Physical Chemistry. C, Nanomaterials and Interfaces|October 26, 2020
Electron-Enhanced Atomic Layer Deposition of Boron Nitride Thin Films at Room Temperature and 100 °CJaclyn K Sprenger, Huaxing Sun, Andrew S Cavanagh, et al.
Nanotechnology|February 19, 2019
UV LEDs based on p-i-n core-shell AlGaN/GaN nanowire heterostructures grown by N-polar selective area epitaxyMatt D Brubaker, Kristen L Genter, Alexana Roshko, et al.
Journal of Materials Research|July 6, 2019
Comparison of convergent beam electron diffraction and annular bright field atomic imaging for GaN polarity determinationAlexana Roshko, Matt D Brubaker, Paul T Blanchard, et al.
Nanotechnology|August 23, 2012
Microstructure evolution and development of annealed Ni/Au contacts to GaN nanowiresAndrew M Herrero, Paul T Blanchard, Aric Sanders, et al.
Nanotechnology|June 25, 2020
Crystallographic polarity measurements in two-terminal GaN nanowire devices by lateral piezoresponse force microscopyMatt D Brubaker, Alexana Roshko, Samuel Berweger, et al.
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