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Alexander Tselev

Showing results (1-10 of 54) with videos related to

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Applied Physics Letters|January 13, 2022
<i>In-situ</i> Near-Field Probe Microscopy of Plasma ProcessingAlexander Tselev, Jeffrey Fagan, Andrei Kolmakov
Nano Letters|December 12, 2007
Microwave impedance spectroscopy of dense carbon nanotube bundlesAlexander Tselev, Michael Woodson, Cheng Qian, et al.
The Review of Scientific Instruments|May 5, 2007
Broadband dielectric microwave microscopy on micron length scalesAlexander Tselev, Steven M Anlage, Zhengkun Ma, et al.
Advanced Materials (Deerfield Beach, Fla.)|January 27, 2012
Free-standing ferroelectric nanotubes processed via soft-template infiltrationAshley Bernal, Alexander Tselev, Sergei Kalinin, et al.
Ultramicroscopy|November 29, 2017
An atomic force microscopy mode for nondestructive electromechanical studies and its application to diphenylalanine peptide nanotubesArseny Kalinin, Valentin Atepalikhin, Oleg Pakhomov, et al.
ACS Nano|October 1, 2014
Big-data reflection high energy electron diffraction analysis for understanding epitaxial film growth processesRama K Vasudevan, Alexander Tselev, Arthur P Baddorf, et al.
ACS Nano|June 21, 2011
The role of electrochemical phenomena in scanning probe microscopy of ferroelectric thin filmsSergei V Kalinin, Stephen Jesse, Alexander Tselev, et al.
ACS Nano|February 12, 2016
Seeing through Walls at the Nanoscale: Microwave Microscopy of Enclosed Objects and Processes in LiquidsAlexander Tselev, Jeyavel Velmurugan, Anton V Ievlev, et al.
Scientific Reports|July 8, 2016
Local coexistence of VO2 phases revealed by deep data analysisEvgheni Strelcov, Anton Ievlev, Alex Belianinov, et al.
Nanotechnology|September 16, 2016
Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopyNina Balke, Stephen Jesse, Pu Yu, et al.
Pageof 6

Showing results (1-10 of 54) with videos related to

Sort By:
Pageof 6
Applied Physics Letters|January 13, 2022
<i>In-situ</i> Near-Field Probe Microscopy of Plasma ProcessingAlexander Tselev, Jeffrey Fagan, Andrei Kolmakov
Nano Letters|December 12, 2007
Microwave impedance spectroscopy of dense carbon nanotube bundlesAlexander Tselev, Michael Woodson, Cheng Qian, et al.
The Review of Scientific Instruments|May 5, 2007
Broadband dielectric microwave microscopy on micron length scalesAlexander Tselev, Steven M Anlage, Zhengkun Ma, et al.
Advanced Materials (Deerfield Beach, Fla.)|January 27, 2012
Free-standing ferroelectric nanotubes processed via soft-template infiltrationAshley Bernal, Alexander Tselev, Sergei Kalinin, et al.
Ultramicroscopy|November 29, 2017
An atomic force microscopy mode for nondestructive electromechanical studies and its application to diphenylalanine peptide nanotubesArseny Kalinin, Valentin Atepalikhin, Oleg Pakhomov, et al.
ACS Nano|October 1, 2014
Big-data reflection high energy electron diffraction analysis for understanding epitaxial film growth processesRama K Vasudevan, Alexander Tselev, Arthur P Baddorf, et al.
ACS Nano|June 21, 2011
The role of electrochemical phenomena in scanning probe microscopy of ferroelectric thin filmsSergei V Kalinin, Stephen Jesse, Alexander Tselev, et al.
ACS Nano|February 12, 2016
Seeing through Walls at the Nanoscale: Microwave Microscopy of Enclosed Objects and Processes in LiquidsAlexander Tselev, Jeyavel Velmurugan, Anton V Ievlev, et al.
Scientific Reports|July 8, 2016
Local coexistence of VO2 phases revealed by deep data analysisEvgheni Strelcov, Anton Ievlev, Alex Belianinov, et al.
Nanotechnology|September 16, 2016
Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopyNina Balke, Stephen Jesse, Pu Yu, et al.
Pageof 6