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Alexander Tselev

Showing results (21-30 of 54) with videos related to

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Nano Letters|March 28, 2007
Magnetically induced field effect in carbon nanotube devicesGeorgy Fedorov, Alexander Tselev, David Jiménez, et al.
ACS Nano|January 7, 2015
Probing local bias-induced transitions using photothermal excitation contact resonance atomic force microscopy and voltage spectroscopyQian Li, Stephen Jesse, Alexander Tselev, et al.
Nature Communications|June 1, 2016
Microwave a.c. conductivity of domain walls in ferroelectric thin filmsAlexander Tselev, Pu Yu, Ye Cao, et al.
Nano Letters|January 23, 2009
Selective growth of well-aligned semiconducting single-walled carbon nanotubesLei Ding, Alexander Tselev, Jinyong Wang, et al.
Nanotechnology|September 6, 2012
Near-field microwave scanning probe imaging of conductivity inhomogeneities in CVD grapheneAlexander Tselev, Nickolay V Lavrik, Ivan Vlassiouk, et al.
ACS Applied Materials & Interfaces|December 17, 2020
Probing Electrified Liquid-Solid Interfaces with Scanning Electron MicroscopyHongxuan Guo, Alexander Yulaev, Evgheni Strelcov, et al.
Beilstein Journal of Nanotechnology|February 12, 2015
Kelvin probe force microscopy in liquid using electrochemical force microscopyLiam Collins, Stephen Jesse, Jason I Kilpatrick, et al.
Nano Letters|August 3, 2010
Real space mapping of Li-ion transport in amorphous Si anodes with nanometer resolutionNina Balke, Stephen Jesse, Yoongu Kim, et al.
ACS Nano|April 11, 2013
Oxygen control of atomic structure and physical properties of SrRuO3 surfacesAlexander Tselev, P Ganesh, Liang Qiao, et al.
ACS Nano|August 24, 2013
Toward quantitative electrochemical measurements on the nanoscale by scanning probe microscopy: environmental and current spreading effectsThomas M Arruda, Amit Kumar, Stephen Jesse, et al.
Pageof 6

Showing results (21-30 of 54) with videos related to

Sort By:
Pageof 6
Nano Letters|March 28, 2007
Magnetically induced field effect in carbon nanotube devicesGeorgy Fedorov, Alexander Tselev, David Jiménez, et al.
ACS Nano|January 7, 2015
Probing local bias-induced transitions using photothermal excitation contact resonance atomic force microscopy and voltage spectroscopyQian Li, Stephen Jesse, Alexander Tselev, et al.
Nature Communications|June 1, 2016
Microwave a.c. conductivity of domain walls in ferroelectric thin filmsAlexander Tselev, Pu Yu, Ye Cao, et al.
Nano Letters|January 23, 2009
Selective growth of well-aligned semiconducting single-walled carbon nanotubesLei Ding, Alexander Tselev, Jinyong Wang, et al.
Nanotechnology|September 6, 2012
Near-field microwave scanning probe imaging of conductivity inhomogeneities in CVD grapheneAlexander Tselev, Nickolay V Lavrik, Ivan Vlassiouk, et al.
ACS Applied Materials & Interfaces|December 17, 2020
Probing Electrified Liquid-Solid Interfaces with Scanning Electron MicroscopyHongxuan Guo, Alexander Yulaev, Evgheni Strelcov, et al.
Beilstein Journal of Nanotechnology|February 12, 2015
Kelvin probe force microscopy in liquid using electrochemical force microscopyLiam Collins, Stephen Jesse, Jason I Kilpatrick, et al.
Nano Letters|August 3, 2010
Real space mapping of Li-ion transport in amorphous Si anodes with nanometer resolutionNina Balke, Stephen Jesse, Yoongu Kim, et al.
ACS Nano|April 11, 2013
Oxygen control of atomic structure and physical properties of SrRuO3 surfacesAlexander Tselev, P Ganesh, Liang Qiao, et al.
ACS Nano|August 24, 2013
Toward quantitative electrochemical measurements on the nanoscale by scanning probe microscopy: environmental and current spreading effectsThomas M Arruda, Amit Kumar, Stephen Jesse, et al.
Pageof 6