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Acta Crystallographica. Section A, Foundations of Crystallography
|
April 14, 2011
Simultaneous determination of highly precise Debye-Waller factors and multiple structure factors for chemically ordered tetragonal FePd
Xiahan Sang, Andreas Kulovits, Jorg Wiezorek
Ultramicroscopy
|
February 12, 2013
Comparison of convergent beam electron diffraction methods for simultaneous structure and Debye Waller factor determination
Xiahan Sang, Andreas Kulovits, Jörg Wiezorek
The Journal of Chemical Physics
|
March 8, 2013
Validation of density functionals for transition metals and intermetallics using data from quantitative electron diffraction
Xiahan Sang, Andreas Kulovits, Guofeng Wang, et al.
Nature Communications
|
July 1, 2025
Revealing disorder parameter and deformation electron density using electron diffraction
Weixiao Lin, Zefan Xue, Wenjun Cui, et al.
Micron (Oxford, England : 1993)
|
May 19, 2012
Approaches for ultrafast imaging of transient materials processes in the transmission electron microscope
Thomas LaGrange, Bryan W Reed, Melissa K Santala, et al.
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of 1
Search research articles
Search
Showing results (1-10 of 5) with videos related to
Sort By:
Page
of 1
Acta Crystallographica. Section A, Foundations of Crystallography
|
April 14, 2011
Simultaneous determination of highly precise Debye-Waller factors and multiple structure factors for chemically ordered tetragonal FePd
Xiahan Sang, Andreas Kulovits, Jorg Wiezorek
Ultramicroscopy
|
February 12, 2013
Comparison of convergent beam electron diffraction methods for simultaneous structure and Debye Waller factor determination
Xiahan Sang, Andreas Kulovits, Jörg Wiezorek
The Journal of Chemical Physics
|
March 8, 2013
Validation of density functionals for transition metals and intermetallics using data from quantitative electron diffraction
Xiahan Sang, Andreas Kulovits, Guofeng Wang, et al.
Nature Communications
|
July 1, 2025
Revealing disorder parameter and deformation electron density using electron diffraction
Weixiao Lin, Zefan Xue, Wenjun Cui, et al.
Micron (Oxford, England : 1993)
|
May 19, 2012
Approaches for ultrafast imaging of transient materials processes in the transmission electron microscope
Thomas LaGrange, Bryan W Reed, Melissa K Santala, et al.
Page
of 1