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Arent J Kievits

Showing results (1-10 of 4) with videos related to

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Journal of Microscopy|July 10, 2022
How innovations in methodology offer new prospects for volume electron microscopyArent J Kievits, Ryan Lane, Elizabeth C Carroll, et al.
Ultramicroscopy|November 6, 2023
Optical STEM detection for scanning electron microscopyArent J Kievits, B H Peter Duinkerken, Job Fermie, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 2, 2025
Sample Processing and Benchmarking for Multibeam Optical Scanning Transmission Electron MicroscopyB H Peter Duinkerken, Arent J Kievits, Anouk H G Wolters, et al.
Methods in Microscopy|August 9, 2024
FAST-EM array tomography: a workflow for multibeam volume electron microscopyArent J Kievits, B H Peter Duinkerken, Ryan Lane, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
Journal of Microscopy|July 10, 2022
How innovations in methodology offer new prospects for volume electron microscopyArent J Kievits, Ryan Lane, Elizabeth C Carroll, et al.
Ultramicroscopy|November 6, 2023
Optical STEM detection for scanning electron microscopyArent J Kievits, B H Peter Duinkerken, Job Fermie, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 2, 2025
Sample Processing and Benchmarking for Multibeam Optical Scanning Transmission Electron MicroscopyB H Peter Duinkerken, Arent J Kievits, Anouk H G Wolters, et al.
Methods in Microscopy|August 9, 2024
FAST-EM array tomography: a workflow for multibeam volume electron microscopyArent J Kievits, B H Peter Duinkerken, Ryan Lane, et al.
Pageof 1