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Aspnes

Showing results (21-30 of 89) with videos related to

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Applied Optics|October 14, 2010
Optical-standard surfaces of single-crystal silicon for calibrating ellipsometers and reflectometersT Yasuda, D E Aspnes
Physical Review Letters|December 12, 1988
Kinetic limits of monolayer growth on (001) GaAs by organometallic chemical-vapor depositionAspnes, Colas, Studna, et al.
Physical Review. B, Condensed Matter|March 1, 1988
Correlation of dopant-induced optical transitions with superconductivity in La2-xSrxCuO4- deltaEtemad, Aspnes, Kelly, et al.
Physical Review Letters|February 3, 1992
Surface science at atmospheric pressure: Reconstructions on (001) GaAs in organometallic chemical vapor depositionKamiya, Aspnes, Tanaka, et al.
Physical Review Letters|January 8, 1990
Direct optical measurement of surface dielectric responses: Interrupted growth on (001) GaAsAspnes, Chang, Studna, et al.
Applied Optics|April 15, 1986
Multiple determination of the optical constants of thin-film coating materials: a Rh sequelD E Aspnes, H G Craighead
Applied Optics|February 6, 2010
High precision scanning ellipsometerD E Aspnes, A A Studna
The Review of Scientific Instruments|March 1, 1978
Methods for drift stabilization and photomultiplier linearization for photometric ellipsometers and polarimetersD E Aspnes, A A Studna
Physical Review. B, Condensed Matter|July 1, 1988
Oxygen-deficiency-induced localized optical excitations in YBa2CuKelly, Barboux, Tarascon, et al.
Applied Optics|January 23, 2010
Geometrically exact ellipsometer alignmentD E Aspnes, A A Studna
Pageof 9

Showing results (21-30 of 89) with videos related to

Sort By:
Pageof 9
Applied Optics|October 14, 2010
Optical-standard surfaces of single-crystal silicon for calibrating ellipsometers and reflectometersT Yasuda, D E Aspnes
Physical Review Letters|December 12, 1988
Kinetic limits of monolayer growth on (001) GaAs by organometallic chemical-vapor depositionAspnes, Colas, Studna, et al.
Physical Review. B, Condensed Matter|March 1, 1988
Correlation of dopant-induced optical transitions with superconductivity in La2-xSrxCuO4- deltaEtemad, Aspnes, Kelly, et al.
Physical Review Letters|February 3, 1992
Surface science at atmospheric pressure: Reconstructions on (001) GaAs in organometallic chemical vapor depositionKamiya, Aspnes, Tanaka, et al.
Physical Review Letters|January 8, 1990
Direct optical measurement of surface dielectric responses: Interrupted growth on (001) GaAsAspnes, Chang, Studna, et al.
Applied Optics|April 15, 1986
Multiple determination of the optical constants of thin-film coating materials: a Rh sequelD E Aspnes, H G Craighead
Applied Optics|February 6, 2010
High precision scanning ellipsometerD E Aspnes, A A Studna
The Review of Scientific Instruments|March 1, 1978
Methods for drift stabilization and photomultiplier linearization for photometric ellipsometers and polarimetersD E Aspnes, A A Studna
Physical Review. B, Condensed Matter|July 1, 1988
Oxygen-deficiency-induced localized optical excitations in YBa2CuKelly, Barboux, Tarascon, et al.
Applied Optics|January 23, 2010
Geometrically exact ellipsometer alignmentD E Aspnes, A A Studna
Pageof 9