Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Axel Wiegmann

Showing results (1-10 of 5) with videos related to

Pageof 1
Sort By:
Optics Express|June 17, 2009
Human face measurement by projecting bandlimited random patternsAxel Wiegmann, Holger Wagner, Richard Kowarschik
Optics Express|June 25, 2009
Suppression of aliasing in multi-sensor scanning absolute profile measurementAxel Wiegmann, Michael Schulz, Clemens Elster
Optics Express|August 20, 2010
Improving the lateral resolution of a multi-sensor profile measurement method by non-equidistant sensor spacingAxel Wiegmann, Michael Schulz, Clemens Elster
Optics Express|October 17, 2014
Analytical Jacobian and its application to tilted-wave interferometryInes Fortmeier, Manuel Stavridis, Axel Wiegmann, et al.
Optics Express|February 25, 2016
Evaluation of absolute form measurements using a tilted-wave interferometerInes Fortmeier, Manuel Stavridis, Axel Wiegmann, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Optics Express|June 17, 2009
Human face measurement by projecting bandlimited random patternsAxel Wiegmann, Holger Wagner, Richard Kowarschik
Optics Express|June 25, 2009
Suppression of aliasing in multi-sensor scanning absolute profile measurementAxel Wiegmann, Michael Schulz, Clemens Elster
Optics Express|August 20, 2010
Improving the lateral resolution of a multi-sensor profile measurement method by non-equidistant sensor spacingAxel Wiegmann, Michael Schulz, Clemens Elster
Optics Express|October 17, 2014
Analytical Jacobian and its application to tilted-wave interferometryInes Fortmeier, Manuel Stavridis, Axel Wiegmann, et al.
Optics Express|February 25, 2016
Evaluation of absolute form measurements using a tilted-wave interferometerInes Fortmeier, Manuel Stavridis, Axel Wiegmann, et al.
Pageof 1