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Applied Optics|March 20, 2008
Particle-size analysis by laser diffraction with a complementary metal-oxide semiconductor pixel arrayZ Ma, H G Merkus, B ScarlettApplied Optics|September 24, 2010
Design of a scanning ellipsometer by synchronous rotation of the polarizer and analyzerL Y Chen, X W Feng, Y Su, et al.Applied Optics|June 29, 2010
Evolution of thermochromism during oxidation of evaporated vanadium filmsS J Jiang, C B Ye, M S Khan, et al.Applied Optics|June 17, 2020
Sapphire Fabry-Perot interferometer for high-temperature pressure sensingZ Wang, J Chen, H Wei, et al.Pageof 1