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Ben Buse

Showing results (1-10 of 11) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 17, 2015
Importance of Carbon Contamination in High-Resolution (FEG) EPMA of Silicate MineralsBen Buse, Stuart Kearns
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 28, 2018
Quantification of Olivine Using Fe Lα in Electron Probe Microanalysis (EPMA)Ben Buse, Stuart Kearns
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 22, 2018
Evaluating X-Ray Microanalysis Phase Maps Using Principal Component AnalysisBen Buse, Stuart Kearns
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 6, 2016
Decontamination in the Electron Probe Microanalysis with a Peltier-Cooled Cold FingerBen Buse, Stuart Kearns, Charles Clapham, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 18, 2021
Low-Voltage Electron-Probe Microanalysis of UraniumMike B Matthews, Stuart L Kearns, Ben Buse
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 17, 2019
Electron Probe Microanalysis Through Coated Oxidized SurfacesMike B Matthews, Ben Buse, Stuart L Kearns
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 17, 2018
Electron Beam-Induced Carbon Erosion and the Impact on Electron Probe MicroanalysisMike B Matthews, Stuart L Kearns, Ben Buse
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 28, 2018
The Accuracy of Al and Cu Film Thickness Determinations and the Implications for Electron Probe MicroanalysisMike B Matthews, Stuart L Kearns, Ben Buse
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 4, 2018
Secondary Fluorescence in WDS: The Role of Spectrometer PositioningBen Buse, Jon Wade, Xavier Llovet, et al.
Scientific Reports|March 2, 2025
Crystallographic and geochemical responses of giant clams on turbid reefsKimberley Mills, Sindia Sosdian, Duncan D Muir, et al.
Pageof 2

Showing results (1-10 of 11) with videos related to

Sort By:
Pageof 2
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 17, 2015
Importance of Carbon Contamination in High-Resolution (FEG) EPMA of Silicate MineralsBen Buse, Stuart Kearns
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 28, 2018
Quantification of Olivine Using Fe Lα in Electron Probe Microanalysis (EPMA)Ben Buse, Stuart Kearns
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 22, 2018
Evaluating X-Ray Microanalysis Phase Maps Using Principal Component AnalysisBen Buse, Stuart Kearns
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 6, 2016
Decontamination in the Electron Probe Microanalysis with a Peltier-Cooled Cold FingerBen Buse, Stuart Kearns, Charles Clapham, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 18, 2021
Low-Voltage Electron-Probe Microanalysis of UraniumMike B Matthews, Stuart L Kearns, Ben Buse
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 17, 2019
Electron Probe Microanalysis Through Coated Oxidized SurfacesMike B Matthews, Ben Buse, Stuart L Kearns
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 17, 2018
Electron Beam-Induced Carbon Erosion and the Impact on Electron Probe MicroanalysisMike B Matthews, Stuart L Kearns, Ben Buse
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 28, 2018
The Accuracy of Al and Cu Film Thickness Determinations and the Implications for Electron Probe MicroanalysisMike B Matthews, Stuart L Kearns, Ben Buse
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 4, 2018
Secondary Fluorescence in WDS: The Role of Spectrometer PositioningBen Buse, Jon Wade, Xavier Llovet, et al.
Scientific Reports|March 2, 2025
Crystallographic and geochemical responses of giant clams on turbid reefsKimberley Mills, Sindia Sosdian, Duncan D Muir, et al.
Pageof 2