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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 4, 2018
Secondary Fluorescence in WDS: The Role of Spectrometer PositioningBen Buse, Jon Wade, Xavier Llovet, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 22, 2018
Evaluating X-Ray Microanalysis Phase Maps Using Principal Component AnalysisBen Buse, Stuart KearnsMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 17, 2015
Importance of Carbon Contamination in High-Resolution (FEG) EPMA of Silicate MineralsBen Buse, Stuart KearnsMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 28, 2018
Quantification of Olivine Using Fe Lα in Electron Probe Microanalysis (EPMA)Ben Buse, Stuart KearnsMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 6, 2016
Decontamination in the Electron Probe Microanalysis with a Peltier-Cooled Cold FingerBen Buse, Stuart Kearns, Charles Clapham, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 25, 2009
Electron probe microanalysis of thin films and multilayers using the computer program XFILMXavier Llovet, Claude MerletMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 1, 2020
Determination of Mass Attenuation Coefficients of Th, U, Np, and Pu for Oxygen Kα X-Rays Using an Electron MicroprobePhilipp Pöml, Xavier LlovetMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 16, 2017
PENEPMA: A Monte Carlo Program for the Simulation of X-Ray Emission in Electron Probe MicroanalysisXavier Llovet, Francesc SalvatMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 13, 2015
Electron Probe Microanalysis: A Review of the Past, Present, and FutureRomano Rinaldi, Xavier LlovetMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 1, 2013
Analysis of chemical changes and microstructure characterization during deformation in ferritic stainless steelAndrés Núñez, Xavier Llovet, Juan F AlmagroPageof 4