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Bernard Drévillon

Showing results (1-10 of 11) with videos related to

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Applied Optics|July 9, 2002
Muller matrix measurements of small spherical particles deposited on a c-Si waferBernard Kaplan, Bernard Drévillon
Applied Optics|August 3, 2002
Direct numerical inversion method for kinetic ellipsometric data. I. Presentation of the method and numerical evaluationDmitri Kouznetsov, Alfred Hofrichter, Bernard Drévillon
Applied Optics|August 3, 2002
Direct numerical inversion method for kinetic ellipsometric data. II. Implementation and experimental verificationAlfred Hofrichter, Dmitri Kouznetsov, Pavel Bulkin, et al.
Applied Optics|March 11, 2004
Characterization of bidimensional gratings by spectroscopic ellipsometry and angle-resolved Mueller polarimetryBernard Kaplan, Tatiana Novikova, Antonello De Martino, et al.
Applied Optics|May 26, 2006
Application of Mueller polarimetry in conical diffraction for critical dimension measurements in microelectronicsTatiana Novikova, Antonello De Martino, Sami Ben Hatit, et al.
Applied Optics|December 13, 2002
Application of Fourier transform infrared ellipsometry to assess the concentration of biological moleculesEnric Garcia-Caurel, Bernard Drévillon, Antonello De Martino, et al.
Applied Optics|May 18, 2004
Mueller polarimetric imaging system with liquid crystalsBlandine Laude-Boulesteix, Antonello De Martino, Bernard Drévillon, et al.
Applied Optics|November 5, 2002
Full-field optical coherence tomography with thermal lightBlandine Laude, Antonello De Martino, Bernard Drévillon, et al.
Applied Optics|November 2, 2007
Correlation of sidelobe suppression between rugate filters and multilayer mirrorsBicher Haj Ibrahim, Roelene Botha, Jean-Eric Bourée, et al.
Optics Letters|April 22, 2003
Optimized Mueller polarimeter with liquid crystalsAntonello De Martino, Yong-Ki Kim, Enric Garcia-Caurel, et al.
Pageof 2

Showing results (1-10 of 11) with videos related to

Sort By:
Pageof 2
Applied Optics|July 9, 2002
Muller matrix measurements of small spherical particles deposited on a c-Si waferBernard Kaplan, Bernard Drévillon
Applied Optics|August 3, 2002
Direct numerical inversion method for kinetic ellipsometric data. I. Presentation of the method and numerical evaluationDmitri Kouznetsov, Alfred Hofrichter, Bernard Drévillon
Applied Optics|August 3, 2002
Direct numerical inversion method for kinetic ellipsometric data. II. Implementation and experimental verificationAlfred Hofrichter, Dmitri Kouznetsov, Pavel Bulkin, et al.
Applied Optics|March 11, 2004
Characterization of bidimensional gratings by spectroscopic ellipsometry and angle-resolved Mueller polarimetryBernard Kaplan, Tatiana Novikova, Antonello De Martino, et al.
Applied Optics|May 26, 2006
Application of Mueller polarimetry in conical diffraction for critical dimension measurements in microelectronicsTatiana Novikova, Antonello De Martino, Sami Ben Hatit, et al.
Applied Optics|December 13, 2002
Application of Fourier transform infrared ellipsometry to assess the concentration of biological moleculesEnric Garcia-Caurel, Bernard Drévillon, Antonello De Martino, et al.
Applied Optics|May 18, 2004
Mueller polarimetric imaging system with liquid crystalsBlandine Laude-Boulesteix, Antonello De Martino, Bernard Drévillon, et al.
Applied Optics|November 5, 2002
Full-field optical coherence tomography with thermal lightBlandine Laude, Antonello De Martino, Bernard Drévillon, et al.
Applied Optics|November 2, 2007
Correlation of sidelobe suppression between rugate filters and multilayer mirrorsBicher Haj Ibrahim, Roelene Botha, Jean-Eric Bourée, et al.
Optics Letters|April 22, 2003
Optimized Mueller polarimeter with liquid crystalsAntonello De Martino, Yong-Ki Kim, Enric Garcia-Caurel, et al.
Pageof 2