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Bryan M Barnes

Showing results (1-10 of 11) with videos related to

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Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3|October 31, 2024
Evaluating the Effects of Modeling Errors for Isolated Finite 3D TargetsMark-Alexander Henn, Bryan M Barnes, Hui Zhou
OSA Continuum|December 12, 2019
Data-driven approaches to optical patterned defect detectionMark-Alexander Henn, Hui Zhou, Bryan M Barnes
Optik|March 6, 2018
Design of angle-resolved illumination optics using nonimaging bi-telecentricity for 193 nm scatterfield microscopyMartin Y Sohn, Bryan M Barnes, Richard M Silver
Applied Optics|September 5, 2012
Improving optical measurement uncertainty with combined multitool metrology using a Bayesian approachNien Fan Zhang, Richard M Silver, Hui Zhou, et al.
Applied Optics|October 3, 2013
Fourier domain optical tool normalization for quantitative parametric image reconstructionJing Qin, Richard M Silver, Bryan M Barnes, et al.
Optics Letters|November 3, 2016
Optimizing the nanoscale quantitative optical imaging of subfield scattering targetsMark-Alexander Henn, Bryan M Barnes, Hui Zhou, et al.
Measurement Science & Technology|October 31, 2024
Combining model-based measurement results of critical dimensions from multiple toolsNien Fan Zhang, Bryan M Barnes, Hui Zhou, et al.
Light, Science & Applications|March 1, 2016
Deep-subwavelength Nanometric Image Reconstruction using Fourier Domain Optical NormalizationJing Qin, Richard M Silver, Bryan M Barnes, et al.
Applied Optics|June 21, 2007
Scatterfield microscopy for extending the limits of image-based optical metrologyRichard M Silver, Bryan M Barnes, Ravikiran Attota, et al.
Optics Express|November 13, 2013
Three-dimensional deep sub-wavelength defect detection using λ = 193 nm optical microscopyBryan M Barnes, Martin Y Sohn, Francois Goasmat, et al.
Pageof 2

Showing results (1-10 of 11) with videos related to

Sort By:
Pageof 2
Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3|October 31, 2024
Evaluating the Effects of Modeling Errors for Isolated Finite 3D TargetsMark-Alexander Henn, Bryan M Barnes, Hui Zhou
OSA Continuum|December 12, 2019
Data-driven approaches to optical patterned defect detectionMark-Alexander Henn, Hui Zhou, Bryan M Barnes
Optik|March 6, 2018
Design of angle-resolved illumination optics using nonimaging bi-telecentricity for 193 nm scatterfield microscopyMartin Y Sohn, Bryan M Barnes, Richard M Silver
Applied Optics|September 5, 2012
Improving optical measurement uncertainty with combined multitool metrology using a Bayesian approachNien Fan Zhang, Richard M Silver, Hui Zhou, et al.
Applied Optics|October 3, 2013
Fourier domain optical tool normalization for quantitative parametric image reconstructionJing Qin, Richard M Silver, Bryan M Barnes, et al.
Optics Letters|November 3, 2016
Optimizing the nanoscale quantitative optical imaging of subfield scattering targetsMark-Alexander Henn, Bryan M Barnes, Hui Zhou, et al.
Measurement Science & Technology|October 31, 2024
Combining model-based measurement results of critical dimensions from multiple toolsNien Fan Zhang, Bryan M Barnes, Hui Zhou, et al.
Light, Science & Applications|March 1, 2016
Deep-subwavelength Nanometric Image Reconstruction using Fourier Domain Optical NormalizationJing Qin, Richard M Silver, Bryan M Barnes, et al.
Applied Optics|June 21, 2007
Scatterfield microscopy for extending the limits of image-based optical metrologyRichard M Silver, Bryan M Barnes, Ravikiran Attota, et al.
Optics Express|November 13, 2013
Three-dimensional deep sub-wavelength defect detection using λ = 193 nm optical microscopyBryan M Barnes, Martin Y Sohn, Francois Goasmat, et al.
Pageof 2