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C Joy

Showing results (1-10 of 102) with videos related to

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Critical Care Nursing Clinics of North America|March 1, 1989
Pediatric cerebral resuscitationC Joy
Critical Care Nursing Clinics of North America|September 1, 1990
Pediatric spinal cord injuryC Joy
Journal of Microscopy|September 2, 1998
The efficiency of X-ray production at low energiesD C Joy
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 25, 2003
Fundamental Constants for Quantitative X-ray MicroanalysisDavid C. Joy
Nature Materials|September 24, 2009
Scanning electron microscopy: Second best no moreDavid C Joy
Journal of Microscopy|October 9, 2002
SMART--a program to measure SEM resolution and imaging performanceD C Joy
Scanning|November 13, 2004
A novel technique for visualizing electron beam induced chargingXiaohu Tang, David C Joy
Microscopy Research and Technique|October 1, 1993
A simple specimen holder for EBIC imaging on the Hitachi S800X Zhang, D C Joy
Scanning|August 21, 2003
Quantitative measurements of charging in a gaseous environmentXiaohu Tang, David C Joy
Scanning|December 24, 2005
An experimental model of beam broadening in the variable pressure scanning electron microscopeXiaohu Tang, David C Joy
Pageof 11

Showing results (1-10 of 102) with videos related to

Sort By:
Pageof 11
Critical Care Nursing Clinics of North America|March 1, 1989
Pediatric cerebral resuscitationC Joy
Critical Care Nursing Clinics of North America|September 1, 1990
Pediatric spinal cord injuryC Joy
Journal of Microscopy|September 2, 1998
The efficiency of X-ray production at low energiesD C Joy
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 25, 2003
Fundamental Constants for Quantitative X-ray MicroanalysisDavid C. Joy
Nature Materials|September 24, 2009
Scanning electron microscopy: Second best no moreDavid C Joy
Journal of Microscopy|October 9, 2002
SMART--a program to measure SEM resolution and imaging performanceD C Joy
Scanning|November 13, 2004
A novel technique for visualizing electron beam induced chargingXiaohu Tang, David C Joy
Microscopy Research and Technique|October 1, 1993
A simple specimen holder for EBIC imaging on the Hitachi S800X Zhang, D C Joy
Scanning|August 21, 2003
Quantitative measurements of charging in a gaseous environmentXiaohu Tang, David C Joy
Scanning|December 24, 2005
An experimental model of beam broadening in the variable pressure scanning electron microscopeXiaohu Tang, David C Joy
Pageof 11