Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

C S Own

Showing results (1-10 of 6) with videos related to

Pageof 1
Sort By:
Ultramicroscopy|January 11, 2005
EDM 1.0: electron direct methodsR Kilaas, L D Marks, C S Own
Ultramicroscopy|August 30, 2005
Rapid structure determination of a metal oxide from pseudo-kinematical electron diffraction dataC S Own, W Sinkler, L D Marks
Acta Crystallographica. Section A, Foundations of Crystallography|October 24, 2006
Precession electron diffraction 1: multislice simulationC S Own, L D Marks, W Sinkler
Ultramicroscopy|January 9, 2007
Prospects for aberration corrected electron precessionC S Own, W Sinkler, L D Marks
Ultramicroscopy|September 15, 2007
A quantitative analysis of the cone-angle dependence in precession electron diffractionJ Ciston, B Deng, L D Marks, et al.
Ultramicroscopy|December 7, 2007
An electron microscope for the aberration-corrected eraO L Krivanek, G J Corbin, N Dellby, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|January 11, 2005
EDM 1.0: electron direct methodsR Kilaas, L D Marks, C S Own
Ultramicroscopy|August 30, 2005
Rapid structure determination of a metal oxide from pseudo-kinematical electron diffraction dataC S Own, W Sinkler, L D Marks
Acta Crystallographica. Section A, Foundations of Crystallography|October 24, 2006
Precession electron diffraction 1: multislice simulationC S Own, L D Marks, W Sinkler
Ultramicroscopy|January 9, 2007
Prospects for aberration corrected electron precessionC S Own, W Sinkler, L D Marks
Ultramicroscopy|September 15, 2007
A quantitative analysis of the cone-angle dependence in precession electron diffractionJ Ciston, B Deng, L D Marks, et al.
Ultramicroscopy|December 7, 2007
An electron microscope for the aberration-corrected eraO L Krivanek, G J Corbin, N Dellby, et al.
Pageof 1