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Applied Optics|March 14, 2008
High-accuracy fourier transform interferometry, without oversampling, with a 1-bit analog-to-digital converterV R Daria, C SalomaApplied Optics|March 8, 2008
Efficient analysis of temporal broadening of a pulsed focused Gaussian beam in scattering mediaC Mar Blanca, C SalomaApplied Optics|March 22, 2008
Two-color excitation fluorescence microscopy through highly scattering mediaC M Blanca, C SalomaApplied Optics|November 6, 2010
Single-Gaussian-beam interaction with a dielectric microsphere: radiation forces, multiple internal reflections, and caustic structuresC Saloma, M O CambalizaApplied Optics|March 21, 2008
Third-harmonic generation microscopy in highly scattering mediaC M Blanca, C SalomaPhysical Review Letters|June 1, 2001
Solving N-body problems with neural networksM Quito, C Monterola, C SalomaApplied Optics|September 11, 2010
Fourier transform refractometry using multichannel detectionC Saloma, V Darla, J MuñozApplied Optics|August 12, 2010
Photoacoustic depth profiling by cross-correlation using a GaAs light emitting diodeC Saloma, A J de VeraOptics Express|May 7, 2009
Fluorescent image classification by major color histograms and a neural networkM Soriano, L Garcia, C SalomaApplied Optics|March 22, 2008
Optical-feedback semiconductor laser Michelson interferometer for displacement measurements with directional discriminationP J Rodrigo, M Lim, C SalomaPageof 67