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C W Hagen

Showing results (1-10 of 15) with videos related to

Pageof 2
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Nanotechnology|July 2, 2009
Resists for sub-20-nm electron beam lithography with a focus on HSQ: state of the artA E Grigorescu, C W Hagen
Ultramicroscopy|July 12, 2011
Simulation of ion imaging: sputtering, contrast, noiseV Castaldo, C W Hagen, P Kruit
Scanning|August 11, 2006
Resolution limit for electron beam-induced deposition on thick substratesC W Hagen, N Silvis-Cividjian, P Kruit
Scanning|June 7, 2005
Resolution limit for EBID on thick substratesC W Hagen, N Silvis-Cividjian, P Kruit
Nanotechnology|August 27, 2009
Creating pure nanostructures from electron-beam-induced deposition using purification techniques: a technology perspectiveA Botman, J J L Mulders, C W Hagen
Nanotechnology|August 10, 2011
Growth behavior near the ultimate resolution of nanometer-scale focused electron beam-induced depositionW F van Dorp, C W Hagen, P A Crozier, et al.
Ultramicroscopy|December 21, 2002
Low-energy foil aberration correctorR H van Aken, C W Hagen, J E Barth, et al.
Nanotechnology|October 14, 2017
Electron transport and room temperature single-electron charging in 10 nm scale PtC nanostructures formed by electron beam induced depositionZ A K Durrani, M E Jones, C Wang, et al.
Journal of Microscopy|March 23, 2006
Diffraction patterns of artificial two-dimensional crystals synthesized in situ in an environmental scanning transmission electron microscopeW F van Dorp, B van Someren, C W Hagen, et al.
Micromachines|December 30, 2020
Combined Focused Electron Beam-Induced Deposition and Etching for the Patterning of Dense Lines without Interconnecting MaterialSangeetha Hari, P H F Trompenaars, J J L Mulders, et al.
Pageof 2

Showing results (1-10 of 15) with videos related to

Sort By:
Pageof 2
Nanotechnology|July 2, 2009
Resists for sub-20-nm electron beam lithography with a focus on HSQ: state of the artA E Grigorescu, C W Hagen
Ultramicroscopy|July 12, 2011
Simulation of ion imaging: sputtering, contrast, noiseV Castaldo, C W Hagen, P Kruit
Scanning|August 11, 2006
Resolution limit for electron beam-induced deposition on thick substratesC W Hagen, N Silvis-Cividjian, P Kruit
Scanning|June 7, 2005
Resolution limit for EBID on thick substratesC W Hagen, N Silvis-Cividjian, P Kruit
Nanotechnology|August 27, 2009
Creating pure nanostructures from electron-beam-induced deposition using purification techniques: a technology perspectiveA Botman, J J L Mulders, C W Hagen
Nanotechnology|August 10, 2011
Growth behavior near the ultimate resolution of nanometer-scale focused electron beam-induced depositionW F van Dorp, C W Hagen, P A Crozier, et al.
Ultramicroscopy|December 21, 2002
Low-energy foil aberration correctorR H van Aken, C W Hagen, J E Barth, et al.
Nanotechnology|October 14, 2017
Electron transport and room temperature single-electron charging in 10 nm scale PtC nanostructures formed by electron beam induced depositionZ A K Durrani, M E Jones, C Wang, et al.
Journal of Microscopy|March 23, 2006
Diffraction patterns of artificial two-dimensional crystals synthesized in situ in an environmental scanning transmission electron microscopeW F van Dorp, B van Someren, C W Hagen, et al.
Micromachines|December 30, 2020
Combined Focused Electron Beam-Induced Deposition and Etching for the Patterning of Dense Lines without Interconnecting MaterialSangeetha Hari, P H F Trompenaars, J J L Mulders, et al.
Pageof 2