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Optics Express|November 14, 2024
Systematic error calibration of vertical dynamic interferometer with sloshing liquid planeChenhui Hu, Donghui Zheng, Lei ChenOptics Express|June 29, 2023
Non-iterative phase tilt interferometry for the tilt shift calculation and phase extractionZhe Zhang, Donghui Zheng, Lei Chen, et al.Optics Express|October 19, 2022
Iterative correction method of a retrace error in interferometryChenhui Hu, Lei Chen, Donghui Zheng, et al.Optics Express|March 27, 2021
Iterative deformation calibration of a transmission flat via the ring-point support on a 300-mm-aperture vertical Fizeau interferometerYuntao Wang, Lei Chen, Chenhui Hu, et al.Applied Optics|February 23, 2023
System design and error correction of simultaneous phase-shifting point-diffraction interferometer for dynamic wavefront detection with 400 mm apertureDonghui Zheng, Zhiyao Ma, Zhe Zhang, et al.Applied Optics|April 1, 2020
System design and error correction for 300 mm aperture vertical Fizeau spatial-temporal phase-shifting interferometerDonghui Zheng, Lei Chen, Lu Kong, et al.Optics Express|November 11, 2025
Analysis and suppression of random noise effect in interferometry on absolute measurement of shift rotationZhe Zhang, Donghui Zheng, Lei ChenApplied Optics|July 21, 2015
Single-shot reflective shearing point diffraction interferometer for wavefront measurementsWenhua Zhu, Lei Chen, Chenfeng Gu, et al.Applied Optics|January 14, 2017
Phase extraction from fringe pattern via light propagationWenhua Zhu, Lei Chen, Donghui Zheng, et al.Applied Optics|October 20, 2017
Dynamic wavefront measurement with a pinhole linear polarizer point-diffraction interferometerXiang Zhou, Renhui Guo, Wenhua Zhu, et al.Pageof 864