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Journal of Electron Microscopy
|
December 8, 2004
Voltage refinement by deficit HOLZ line geometry
Chris J Rossouw, Christian J Maunders
Ultramicroscopy
|
November 13, 2012
Rapid measurement of nanoparticle thickness profiles
Hadas Katz-Boon, Chris J Rossouw, Christian Dwyer, et al.
Ultramicroscopy
|
November 26, 2013
Channelling contrast analysis of lattice images: conditions for probe-insensitive STEM
Chris J Rossouw, Christian Dwyer, Hadas Katz-Boon, et al.
Nano Letters
|
December 25, 2010
Three-dimensional morphology and crystallography of gold nanorods
Hadas Katz-Boon, Chris J Rossouw, Matthew Weyland, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 4) with videos related to
Sort By:
Page
of 1
Journal of Electron Microscopy
|
December 8, 2004
Voltage refinement by deficit HOLZ line geometry
Chris J Rossouw, Christian J Maunders
Ultramicroscopy
|
November 13, 2012
Rapid measurement of nanoparticle thickness profiles
Hadas Katz-Boon, Chris J Rossouw, Christian Dwyer, et al.
Ultramicroscopy
|
November 26, 2013
Channelling contrast analysis of lattice images: conditions for probe-insensitive STEM
Chris J Rossouw, Christian Dwyer, Hadas Katz-Boon, et al.
Nano Letters
|
December 25, 2010
Three-dimensional morphology and crystallography of gold nanorods
Hadas Katz-Boon, Chris J Rossouw, Matthew Weyland, et al.
Page
of 1