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Craig D McGray

Showing results (1-10 of 6) with videos related to

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Journal of Research of the National Institute of Standards and Technology|May 3, 2016
MEMS Young's Modulus and Step Height Measurements With Round Robin ResultsJanet Marshall, Richard A Allen, Craig D McGray, et al.
Journal of Research of the National Institute of Standards and Technology|December 8, 2021
Gravity-Based Characterization of Three-Axis Accelerometers in Terms of Intrinsic Accelerometer ParametersJon Geist, Muhammad Yaqub Afridi, Craig D McGray, et al.
Journal of Microelectromechanical Systems : a Joint IEEE and ASME Publication on Microstructures, Microactuators, Microsensors, and Microsystems|May 17, 2019
Particle Tracking of Microelectromechanical System Performance and ReliabilityCraig R Copeland, Craig D McGray, Jon Geist, et al.
Microsystems & Nanoengineering|November 15, 2016
Transfer of motion through a microelectromechanical linkage at nanometer and microradian scalesCraig R Copeland, Craig D McGray, Jon Geist, et al.
Nature Communications|June 25, 2021
Accurate localization microscopy by intrinsic aberration calibrationCraig R Copeland, Craig D McGray, B Robert Ilic, et al.
Light, Science & Applications|March 7, 2019
Subnanometer localization accuracy in widefield optical microscopyCraig R Copeland, Jon Geist, Craig D McGray, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Journal of Research of the National Institute of Standards and Technology|May 3, 2016
MEMS Young's Modulus and Step Height Measurements With Round Robin ResultsJanet Marshall, Richard A Allen, Craig D McGray, et al.
Journal of Research of the National Institute of Standards and Technology|December 8, 2021
Gravity-Based Characterization of Three-Axis Accelerometers in Terms of Intrinsic Accelerometer ParametersJon Geist, Muhammad Yaqub Afridi, Craig D McGray, et al.
Journal of Microelectromechanical Systems : a Joint IEEE and ASME Publication on Microstructures, Microactuators, Microsensors, and Microsystems|May 17, 2019
Particle Tracking of Microelectromechanical System Performance and ReliabilityCraig R Copeland, Craig D McGray, Jon Geist, et al.
Microsystems & Nanoengineering|November 15, 2016
Transfer of motion through a microelectromechanical linkage at nanometer and microradian scalesCraig R Copeland, Craig D McGray, Jon Geist, et al.
Nature Communications|June 25, 2021
Accurate localization microscopy by intrinsic aberration calibrationCraig R Copeland, Craig D McGray, B Robert Ilic, et al.
Light, Science & Applications|March 7, 2019
Subnanometer localization accuracy in widefield optical microscopyCraig R Copeland, Jon Geist, Craig D McGray, et al.
Pageof 1