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ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

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JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

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D B Jacobs

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Life Sciences|January 1, 1996

AUUUA-specific mRNA binding proteins in astrocytesD B Jacobs, A M Mandelin, T Giordano, et al.

ACS Applied Materials & Interfaces|September 30, 2017

Tribochemical Wear of Diamond-Like Carbon-Coated Atomic Force Microscope TipsJingjing Liu, Yijie Jiang, David S Grierson, et al.

Nanotechnology|November 15, 2012

Ultrananocrystalline diamond tip integrated onto a heated atomic force microscope cantileverHoe Joon Kim, Nicolaie Moldovan, Jonathan R Felts, et al.

ACS Nano|October 31, 2017

Sub-10 Nanometer Feature Size in Silicon Using Thermal Scanning Probe LithographyYu Kyoung Ryu Cho, Colin D Rawlings, Heiko Wolf, et al.

The Review of Scientific Instruments|December 4, 2018

A simple atomic force microscope-based method for quantifying wear of sliding probesErin E Flater, Jared D Barnes, Jesse A Hitz Graff, et al.

Tribology Letters|July 29, 2025

The Surface-Topography Challenge: A Multi-Laboratory Benchmark Study to Advance the Characterization of TopographyA Pradhan, M H Müser, N Miller, et al.

Pageof 6

Search research articles

Showing results (51-60 of 56) with videos related to

Sort By:

Pageof 6

You have reached the last page of results.This site can display upto 56 results.

Life Sciences|January 1, 1996

AUUUA-specific mRNA binding proteins in astrocytesD B Jacobs, A M Mandelin, T Giordano, et al.

ACS Applied Materials & Interfaces|September 30, 2017

Tribochemical Wear of Diamond-Like Carbon-Coated Atomic Force Microscope TipsJingjing Liu, Yijie Jiang, David S Grierson, et al.

Nanotechnology|November 15, 2012

Ultrananocrystalline diamond tip integrated onto a heated atomic force microscope cantileverHoe Joon Kim, Nicolaie Moldovan, Jonathan R Felts, et al.

ACS Nano|October 31, 2017

Sub-10 Nanometer Feature Size in Silicon Using Thermal Scanning Probe LithographyYu Kyoung Ryu Cho, Colin D Rawlings, Heiko Wolf, et al.

The Review of Scientific Instruments|December 4, 2018

A simple atomic force microscope-based method for quantifying wear of sliding probesErin E Flater, Jared D Barnes, Jesse A Hitz Graff, et al.

Tribology Letters|July 29, 2025

The Surface-Topography Challenge: A Multi-Laboratory Benchmark Study to Advance the Characterization of TopographyA Pradhan, M H Müser, N Miller, et al.

Pageof 6