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D C Joy

Showing results (1-10 of 23) with videos related to

Pageof 3
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Journal of Microscopy|September 2, 1998
The efficiency of X-ray production at low energiesD C Joy
Journal of Microscopy|October 9, 2002
SMART--a program to measure SEM resolution and imaging performanceD C Joy
Microscopy Research and Technique|October 1, 1993
A simple specimen holder for EBIC imaging on the Hitachi S800X Zhang, D C Joy
Scanning|October 6, 2001
Microanalysis using secondary electrons in scanning electron microscopyS Mil'shtein, D C Joy
Science (New York, N.Y.)|October 12, 1979
Inner-shell electron spectroscopy for microanalysisD C Joy, D M Maher
Scanning|June 24, 2008
Special issue in honor of Professor D.B. HoltB G Yacobi, D C Joy
Scanning|September 14, 1999
A study of electron beam-induced conductivity in resistsJ J Hwu, D C Joy
Journal of Microscopy|February 28, 2006
Scanning electron microscope imaging in liquids - some data on electron interactions in waterD C Joy, C S Joy
Scanning|August 21, 2003
Measurements of absolute x-ray generation efficiency for selected K, L, and M-linesM Satya Prasad, D C Joy
Ultramicroscopy|June 1, 1976
The formation and interpretation of defect images from crystalline materials in a scanning transmission electron microscopeD M Maher, D C Joy
Pageof 3

Showing results (1-10 of 23) with videos related to

Sort By:
Pageof 3
Journal of Microscopy|September 2, 1998
The efficiency of X-ray production at low energiesD C Joy
Journal of Microscopy|October 9, 2002
SMART--a program to measure SEM resolution and imaging performanceD C Joy
Microscopy Research and Technique|October 1, 1993
A simple specimen holder for EBIC imaging on the Hitachi S800X Zhang, D C Joy
Scanning|October 6, 2001
Microanalysis using secondary electrons in scanning electron microscopyS Mil'shtein, D C Joy
Science (New York, N.Y.)|October 12, 1979
Inner-shell electron spectroscopy for microanalysisD C Joy, D M Maher
Scanning|June 24, 2008
Special issue in honor of Professor D.B. HoltB G Yacobi, D C Joy
Scanning|September 14, 1999
A study of electron beam-induced conductivity in resistsJ J Hwu, D C Joy
Journal of Microscopy|February 28, 2006
Scanning electron microscope imaging in liquids - some data on electron interactions in waterD C Joy, C S Joy
Scanning|August 21, 2003
Measurements of absolute x-ray generation efficiency for selected K, L, and M-linesM Satya Prasad, D C Joy
Ultramicroscopy|June 1, 1976
The formation and interpretation of defect images from crystalline materials in a scanning transmission electron microscopeD M Maher, D C Joy
Pageof 3