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Journal of Microscopy|July 3, 2004
Experimental secondary electron spectra under SEM conditionsD C Joy, M S Prasad, H M Meyer
Journal of Microscopy|September 2, 1998
The efficiency of X-ray production at low energiesD C Joy
Journal of Microscopy|October 9, 2002
SMART--a program to measure SEM resolution and imaging performanceD C Joy
Science (New York, N.Y.)|October 12, 1979
Inner-shell electron spectroscopy for microanalysisD C Joy, D M Maher
Scanning|September 14, 1999
A study of electron beam-induced conductivity in resistsJ J Hwu, D C Joy
Talanta|May 1, 1983
Chemical and instrumental analysis of ferritesC McCrory-Joy, D C Joy
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