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Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

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JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

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D C Joy

Showing results (11-20 of 23) with videos related to

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Talanta|May 1, 1983

Chemical and instrumental analysis of ferritesC McCrory-Joy, D C Joy

Ultramicroscopy|November 1, 1992

High-resolution scanning electron microscopyD C Joy, J B Pawley

Scanning|August 21, 2003

Experimental resolution measurement in critical dimension scanning electron microscope metrologyG F Lorusso, D C Joy

Ultramicroscopy|June 24, 2016

Monte Carlo modeling of ion beam induced secondary electronsU Huh, W Cho, D C Joy

Journal of Microscopy|July 3, 2004

Experimental secondary electron spectra under SEM conditionsD C Joy, M S Prasad, H M Meyer

Journal of Electron Microscopy Technique|January 1, 1990

High resolution SE-I SEM study of enamel crystal morphologyR P Apkarian, M D Gutekunst, D C Joy

Scanning|November 1, 1996

Measuring the performance of scanning electron microscope detectorsD C Joy, C S Joy, R D Bunn

Scientific Reports|August 30, 2018

Biological serial block face scanning electron microscopy at improved z-resolution based on Monte Carlo modelQ He, M Hsueh, G Zhang, et al.

Journal of Microscopy|August 8, 2009

Diverse and conserved nano- and mesoscale structures of diatom silica revealed by atomic force microscopyM Hildebrand, G Holton, D C Joy, et al.

Science (New York, N.Y.)|May 5, 1978

Fluorinated molecule as a tracer: difluoroserotonin in human platelets mapped by electron energy-loss spectroscopyJ L Costa, D C Joy, D M Maher, et al.

Pageof 3

Search research articles

Showing results (11-20 of 23) with videos related to

Sort By:

Pageof 3

Talanta|May 1, 1983

Chemical and instrumental analysis of ferritesC McCrory-Joy, D C Joy

Ultramicroscopy|November 1, 1992

High-resolution scanning electron microscopyD C Joy, J B Pawley

Scanning|August 21, 2003

Experimental resolution measurement in critical dimension scanning electron microscope metrologyG F Lorusso, D C Joy

Ultramicroscopy|June 24, 2016

Monte Carlo modeling of ion beam induced secondary electronsU Huh, W Cho, D C Joy

Journal of Microscopy|July 3, 2004

Experimental secondary electron spectra under SEM conditionsD C Joy, M S Prasad, H M Meyer

Journal of Electron Microscopy Technique|January 1, 1990

High resolution SE-I SEM study of enamel crystal morphologyR P Apkarian, M D Gutekunst, D C Joy

Scanning|November 1, 1996

Measuring the performance of scanning electron microscope detectorsD C Joy, C S Joy, R D Bunn

Scientific Reports|August 30, 2018

Biological serial block face scanning electron microscopy at improved z-resolution based on Monte Carlo modelQ He, M Hsueh, G Zhang, et al.

Journal of Microscopy|August 8, 2009

Diverse and conserved nano- and mesoscale structures of diatom silica revealed by atomic force microscopyM Hildebrand, G Holton, D C Joy, et al.

Science (New York, N.Y.)|May 5, 1978

Fluorinated molecule as a tracer: difluoroserotonin in human platelets mapped by electron energy-loss spectroscopyJ L Costa, D C Joy, D M Maher, et al.

Pageof 3