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D Schryvers

Showing results (1-10 of 15) with videos related to

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Ultramicroscopy|March 12, 2004
Measuring the absolute position of EELS ionisation edges in a TEMP L Potapov, D Schryvers
Proceedings of the National Academy of Sciences of the United States of America|December 22, 2010
Nanodiamonds do not provide unique evidence for a Younger Dryas impactH Tian, D Schryvers, Ph Claeys
Journal of Microscopy|December 25, 2018
ALPHABETA: a dedicated open-source tool for calculating TEM stage tilt anglesN Cautaerts, R Delville, D Schryvers
Microscopy Research and Technique|September 5, 1998
Transmission electron microscopy studies of (111) twinned silver halide microcrystalsC Goessens, D Schryvers, J Van Landuyt
Journal of Microscopy|April 16, 2003
Study of changes in L32 EELS ionization edges upon formation of Ni-based intermetallic compoundsP L Potapov, S E Kulkova, D Schryvers
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 16, 2009
Microstructure of surface and subsurface layers of a Ni-Ti shape memory microwireH Tian, D Schryvers, S Shabalovskaya, et al.
Journal of Microscopy|August 20, 2016
Internal architecture of coffin-shaped ZSM-5 zeolite crystals with hourglass contrast unravelled by focused ion beam-assisted transmission electron microscopyJ Lu, E Bartholomeeusen, B F Sels, et al.
Journal of Microscopy|November 6, 2010
Characterization of nickel silicides using EELS-based methodsE Verleysen, H Bender, O Richard, et al.
Journal of Microscopy|February 7, 2009
Optimization of a FIB/SEM slice-and-view study of the 3D distribution of Ni4Ti3 precipitates in Ni-TiS Cao, W Tirry, W Van Den Broek, et al.
Science and Technology of Advanced Materials|November 24, 2016
Advanced three-dimensional electron microscopy techniques in the quest for better structural and functional materialsD Schryvers, S Cao, W Tirry, et al.
Pageof 2

Showing results (1-10 of 15) with videos related to

Sort By:
Pageof 2
Ultramicroscopy|March 12, 2004
Measuring the absolute position of EELS ionisation edges in a TEMP L Potapov, D Schryvers
Proceedings of the National Academy of Sciences of the United States of America|December 22, 2010
Nanodiamonds do not provide unique evidence for a Younger Dryas impactH Tian, D Schryvers, Ph Claeys
Journal of Microscopy|December 25, 2018
ALPHABETA: a dedicated open-source tool for calculating TEM stage tilt anglesN Cautaerts, R Delville, D Schryvers
Microscopy Research and Technique|September 5, 1998
Transmission electron microscopy studies of (111) twinned silver halide microcrystalsC Goessens, D Schryvers, J Van Landuyt
Journal of Microscopy|April 16, 2003
Study of changes in L32 EELS ionization edges upon formation of Ni-based intermetallic compoundsP L Potapov, S E Kulkova, D Schryvers
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 16, 2009
Microstructure of surface and subsurface layers of a Ni-Ti shape memory microwireH Tian, D Schryvers, S Shabalovskaya, et al.
Journal of Microscopy|August 20, 2016
Internal architecture of coffin-shaped ZSM-5 zeolite crystals with hourglass contrast unravelled by focused ion beam-assisted transmission electron microscopyJ Lu, E Bartholomeeusen, B F Sels, et al.
Journal of Microscopy|November 6, 2010
Characterization of nickel silicides using EELS-based methodsE Verleysen, H Bender, O Richard, et al.
Journal of Microscopy|February 7, 2009
Optimization of a FIB/SEM slice-and-view study of the 3D distribution of Ni4Ti3 precipitates in Ni-TiS Cao, W Tirry, W Van Den Broek, et al.
Science and Technology of Advanced Materials|November 24, 2016
Advanced three-dimensional electron microscopy techniques in the quest for better structural and functional materialsD Schryvers, S Cao, W Tirry, et al.
Pageof 2