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Ultramicroscopy
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June 23, 2026
Brightness optimization in a 200 keV DTEM source by geometry-driven aberration suppression
Paul Denham, Pietro Musumeci, Daniel J Masiel, et al.
Ultramicroscopy
|
February 22, 2011
Point defect characterization in HAADF-STEM images using multivariate statistical analysis
Michael C Sarahan, Miaofang Chi, Daniel J Masiel, et al.
Chemical Communications (Cambridge, England)
|
April 28, 2005
Silicon-based nanowires from silicon wafers catalyzed by cobalt nanoparticles in a hydrogen environment
Joshua D Carter, Yongquan Qu, Rhiannon Porter, et al.
Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics
|
August 27, 2011
Automatic recovery of missing amplitudes and phases in tilt-limited electron crystallography of two-dimensional crystals
Bryant R Gipson, Daniel J Masiel, Nigel D Browning, et al.
Structural Dynamics (Melville, N.Y.)
|
August 8, 2017
Influence of cathode geometry on electron dynamics in an ultrafast electron microscope
Shaozheng Ji, Luca Piazza, Gaolong Cao, et al.
Chemphyschem : a European Journal of Chemical Physics and Physical Chemistry
|
May 29, 2010
Time-resolved annular dark field imaging of catalyst nanoparticles
Daniel J Masiel, Bryan W Reed, Thomas B Lagrange, et al.
Journal of Colloid and Interface Science
|
March 11, 2008
Recognition of melting of nanoparticle catalysts with cubically shaped Co3O4 nanoparticles
Yongquan Qu, Daniel J Masiel, Neal N Cheng, et al.
Science (New York, N.Y.)
|
August 1, 2024
Event-responsive scanning transmission electron microscopy
Jonathan J P Peters, Bryan W Reed, Yu Jimbo, et al.
Microscopy Research and Technique
|
January 24, 2009
Laser-based in situ techniques: novel methods for generating extreme conditions in TEM samples
Mitra L Taheri, Thomas Lagrange, Bryan W Reed, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 9) with videos related to
Sort By:
Page
of 1
Ultramicroscopy
|
June 23, 2026
Brightness optimization in a 200 keV DTEM source by geometry-driven aberration suppression
Paul Denham, Pietro Musumeci, Daniel J Masiel, et al.
Ultramicroscopy
|
February 22, 2011
Point defect characterization in HAADF-STEM images using multivariate statistical analysis
Michael C Sarahan, Miaofang Chi, Daniel J Masiel, et al.
Chemical Communications (Cambridge, England)
|
April 28, 2005
Silicon-based nanowires from silicon wafers catalyzed by cobalt nanoparticles in a hydrogen environment
Joshua D Carter, Yongquan Qu, Rhiannon Porter, et al.
Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics
|
August 27, 2011
Automatic recovery of missing amplitudes and phases in tilt-limited electron crystallography of two-dimensional crystals
Bryant R Gipson, Daniel J Masiel, Nigel D Browning, et al.
Structural Dynamics (Melville, N.Y.)
|
August 8, 2017
Influence of cathode geometry on electron dynamics in an ultrafast electron microscope
Shaozheng Ji, Luca Piazza, Gaolong Cao, et al.
Chemphyschem : a European Journal of Chemical Physics and Physical Chemistry
|
May 29, 2010
Time-resolved annular dark field imaging of catalyst nanoparticles
Daniel J Masiel, Bryan W Reed, Thomas B Lagrange, et al.
Journal of Colloid and Interface Science
|
March 11, 2008
Recognition of melting of nanoparticle catalysts with cubically shaped Co3O4 nanoparticles
Yongquan Qu, Daniel J Masiel, Neal N Cheng, et al.
Science (New York, N.Y.)
|
August 1, 2024
Event-responsive scanning transmission electron microscopy
Jonathan J P Peters, Bryan W Reed, Yu Jimbo, et al.
Microscopy Research and Technique
|
January 24, 2009
Laser-based in situ techniques: novel methods for generating extreme conditions in TEM samples
Mitra L Taheri, Thomas Lagrange, Bryan W Reed, et al.
Page
of 1