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Journal of Microscopy|September 1, 2007
The preferred CSL misorientation distribution in polycrystalline SrTiO3Myung-Beom Park, Shao-Ju Shih, David J H Cockayne
Journal of Microscopy|September 1, 2007
The interpretation of indexing of high Sigma CSL grain boundaries from ceramicsShao-Ju Shih, Myung-Beom Park, David J H Cockayne
ACS Nano|February 2, 2010
Dependence of surface facet period on the diameter of nanowiresFang Li, Peter D Nellist, Christian Lang, et al.
Nanotechnology|July 7, 2011
Rapid fabrication of nanoneedle arrays by ion sputteringYi-Zhong Huang, David J H Cockayne, Jausovec Ana-Vanessa, et al.
Ultramicroscopy|March 22, 2005
A versatile double aberration-corrected, energy filtered HREM/STEM for materials scienceJohn L Hutchison, John M Titchmarsh, David J H Cockayne, et al.
ACS Nano|June 19, 2010
Direct imaging and chemical identification of the encapsulated metal atoms in bimetallic endofullerene peapodsRebecca J Nicholls, Kasim Sader, Jamie H Warner, et al.
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