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David L Windt

Showing results (1-10 of 22) with videos related to

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The Review of Scientific Instruments|May 3, 2015
Laboratory-based X-ray reflectometer for multilayer characterization in the 15-150 keV energy bandDavid L Windt
The Review of Scientific Instruments|September 7, 2018
Monochromatic mammography using scanning multilayer X-ray mirrorsDavid L Windt
Applied Optics|July 21, 2015
Pd/B4C/Y multilayer coatings for extreme ultraviolet applications near 10  nm wavelengthDavid L Windt, Eric M Gullikson
Applied Optics|September 12, 2009
Performance, structure, and stability of SiC/Al multilayer films for extreme ultraviolet applicationsDavid L Windt, Jeffrey A Bellotti
Optics Letters|May 3, 2008
Normal-incidence silicon-gadolinium multilayers for imaging at 63 nm wavelengthBenjawan Kjornrattanawanich, David L Windt, John F Seely
Optics Letters|November 23, 2007
Normal-incidence reflectance of optimized W /B(4) C x-ray multilayers in the range 1.4 nm < l > 2.4 nmDavid L Windt, Eric M Gullikson, Christopher C Walton
Applied Optics|April 7, 2004
Experimental comparison of extreme-ultraviolet multilayers for solar physicsDavid L Windt, Soizik Donguy, John Seely, et al.
Applied Optics|June 3, 2008
Aperiodic multilayers with enhanced reflectivity for extreme ultraviolet lithographyMichele Suman, Maria-Guglielmina Pelizzo, Piergiorgio Nicolosi, et al.
Applied Optics|October 14, 2009
Extreme-ultraviolet multilayer coatings with high spectral purity for solar imagingMichele Suman, Maria Guglielmina Pelizzo, David L Windt, et al.
Optics Letters|December 14, 2005
Terbium-based extreme ultraviolet multilayersDavid L Windt, John F Seely, Benjawan Kjornrattanawanich, et al.
Pageof 3

Showing results (1-10 of 22) with videos related to

Sort By:
Pageof 3
The Review of Scientific Instruments|May 3, 2015
Laboratory-based X-ray reflectometer for multilayer characterization in the 15-150 keV energy bandDavid L Windt
The Review of Scientific Instruments|September 7, 2018
Monochromatic mammography using scanning multilayer X-ray mirrorsDavid L Windt
Applied Optics|July 21, 2015
Pd/B4C/Y multilayer coatings for extreme ultraviolet applications near 10  nm wavelengthDavid L Windt, Eric M Gullikson
Applied Optics|September 12, 2009
Performance, structure, and stability of SiC/Al multilayer films for extreme ultraviolet applicationsDavid L Windt, Jeffrey A Bellotti
Optics Letters|May 3, 2008
Normal-incidence silicon-gadolinium multilayers for imaging at 63 nm wavelengthBenjawan Kjornrattanawanich, David L Windt, John F Seely
Optics Letters|November 23, 2007
Normal-incidence reflectance of optimized W /B(4) C x-ray multilayers in the range 1.4 nm < l > 2.4 nmDavid L Windt, Eric M Gullikson, Christopher C Walton
Applied Optics|April 7, 2004
Experimental comparison of extreme-ultraviolet multilayers for solar physicsDavid L Windt, Soizik Donguy, John Seely, et al.
Applied Optics|June 3, 2008
Aperiodic multilayers with enhanced reflectivity for extreme ultraviolet lithographyMichele Suman, Maria-Guglielmina Pelizzo, Piergiorgio Nicolosi, et al.
Applied Optics|October 14, 2009
Extreme-ultraviolet multilayer coatings with high spectral purity for solar imagingMichele Suman, Maria Guglielmina Pelizzo, David L Windt, et al.
Optics Letters|December 14, 2005
Terbium-based extreme ultraviolet multilayersDavid L Windt, John F Seely, Benjawan Kjornrattanawanich, et al.
Pageof 3