Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

David R Diercks

Showing results (11-20 of 16) with videos related to

Pageof 2
Sort By:
You have reached the last page of results.This site can display upto 16 results.
Journal of Applied Physics|May 5, 2018
p-type doping efficiency in CdTe: Influence of second phase formationJedidiah J McCoy, Santosh K Swain, John R Sieber, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 18, 2022
Atom Probe Tomography Using a Wavelength-Tunable Femtosecond-Pulsed Coherent Extreme Ultraviolet Light SourceAnn N Chiaramonti, Luis Miaja-Avila, Paul T Blanchard, et al.
MRS Advances|December 1, 2022
A Three-Dimensional Atom Probe Microscope Incorporating a Wavelength-Tuneable Femtosecond-Pulsed Coherent Extreme Ultraviolet Light SourceAnn N Chiaramonti, Luis Miaja-Avila, Paul T Blanchard, et al.
Nano Letters|October 5, 2016
Probing Grain-Boundary Chemistry and Electronic Structure in Proton-Conducting Oxides by Atom Probe TomographyDaniel R Clark, Huayang Zhu, David R Diercks, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 13, 2020
Field Ion Emission in an Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet LightAnn N Chiaramonti, Luis Miaja-Avila, Benjamin W Caplins, et al.
The Journal of Physical Chemistry. C, Nanomaterials and Interfaces|October 9, 2024
Extreme Ultraviolet Radiation Pulsed Atom Probe Tomography of III-Nitride Semiconductor MaterialsLuis Miaja-Avila, Benjamin W Caplins, Ann N Chiaramonti, et al.
Pageof 2

Showing results (11-20 of 16) with videos related to

Sort By:
Pageof 2
You have reached the last page of results.This site can display upto 16 results.
Journal of Applied Physics|May 5, 2018
p-type doping efficiency in CdTe: Influence of second phase formationJedidiah J McCoy, Santosh K Swain, John R Sieber, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 18, 2022
Atom Probe Tomography Using a Wavelength-Tunable Femtosecond-Pulsed Coherent Extreme Ultraviolet Light SourceAnn N Chiaramonti, Luis Miaja-Avila, Paul T Blanchard, et al.
MRS Advances|December 1, 2022
A Three-Dimensional Atom Probe Microscope Incorporating a Wavelength-Tuneable Femtosecond-Pulsed Coherent Extreme Ultraviolet Light SourceAnn N Chiaramonti, Luis Miaja-Avila, Paul T Blanchard, et al.
Nano Letters|October 5, 2016
Probing Grain-Boundary Chemistry and Electronic Structure in Proton-Conducting Oxides by Atom Probe TomographyDaniel R Clark, Huayang Zhu, David R Diercks, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 13, 2020
Field Ion Emission in an Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet LightAnn N Chiaramonti, Luis Miaja-Avila, Benjamin W Caplins, et al.
The Journal of Physical Chemistry. C, Nanomaterials and Interfaces|October 9, 2024
Extreme Ultraviolet Radiation Pulsed Atom Probe Tomography of III-Nitride Semiconductor MaterialsLuis Miaja-Avila, Benjamin W Caplins, Ann N Chiaramonti, et al.
Pageof 2