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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 11, 2014
Surface charge and carbon contamination on an electron-beam-irradiated hydroxyapatite thin film investigated by photoluminescence and phase imaging in atomic force microscopyRadu Hristu, Denis E Tranca, Stefan G Stanciu, et al.
Optics Letters|March 15, 2016
Mapping electron-beam-injected trapped charge with scattering scanning near-field optical microscopyDenis E Tranca, Emilio Sánchez-Ortiga, Genaro Saavedra, et al.
Gigascience|November 24, 2020
SSNOMBACTER: A collection of scattering-type scanning near-field optical microscopy and atomic force microscopy images of bacterial cellsMassimiliano Lucidi, Denis E Tranca, Lorenzo Nichele, et al.
Materials (Basel, Switzerland)|September 20, 2019
Growth Mechanisms and the Effects of Deposition Parameters on the Structure and Properties of High Entropy Film by Magnetron SputteringYanxia Liang, Peipei Wang, Yufei Wang, et al.
Proceedings of the National Academy of Sciences of the United States of America|November 14, 2022
Super-resolution re-scan second harmonic generation microscopyStefan G Stanciu, Radu Hristu, George A Stanciu, et al.
ACS Omega|August 12, 2024
Antibacterial Interactions of Ethanol-Dispersed Multiwalled Carbon Nanotubes with Staphylococcus aureus and Pseudomonas aeruginosaMihaela Asaftei, Massimiliano Lucidi, Stefan Razvan Anton, et al.
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