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Dirch H Petersen

Showing results (1-10 of 15) with videos related to

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Physical Review Letters|March 25, 2014
Theoretical analysis of a dual-probe scanning tunneling microscope setup on grapheneMikkel Settnes, Stephen R Power, Dirch H Petersen, et al.
The Review of Scientific Instruments|October 2, 2017
Breakthrough in current-in-plane tunneling measurement precision by application of multi-variable fitting algorithmAlberto Cagliani, Frederik W Østerberg, Ole Hansen, et al.
Beilstein Journal of Nanotechnology|August 18, 2018
A variable probe pitch micro-Hall effect methodMaria-Louise Witthøft, Frederik W Østerberg, Janusz Bogdanowicz, et al.
Nanotechnology|January 14, 2021
Effective electrical resistivity in a square array of oriented square inclusionsBenny Guralnik, Ole Hansen, Henrik H Henrichsen, et al.
Optics Express|December 25, 2015
Terahertz wafer-scale mobility mapping of graphene on insulating substrates without a gateJonas D Buron, David M A Mackenzie, Dirch H Petersen, et al.
Scientific Reports|July 25, 2015
Graphene mobility mappingJonas D Buron, Filippo Pizzocchero, Peter U Jepsen, et al.
The Review of Scientific Instruments|June 3, 2009
Accurate microfour-point probe sheet resistance measurements on small samplesSune Thorsteinsson, Fei Wang, Dirch H Petersen, et al.
Beilstein Journal of Nanotechnology|July 18, 2018
Electrical characterization of single nanometer-wide Si fins in dense arraysSteven Folkersma, Janusz Bogdanowicz, Andreas Schulze, et al.
Nanotechnology|March 14, 2020
Wafer-scale graphene quality assessment using micro four-point probe mappingDavid M A Mackenzie, Kristoffer G Kalhauge, Patrick R Whelan, et al.
Nano Letters|September 6, 2012
Graphene conductance uniformity mappingJonas D Buron, Dirch H Petersen, Peter Bøggild, et al.
Pageof 2

Showing results (1-10 of 15) with videos related to

Sort By:
Pageof 2
Physical Review Letters|March 25, 2014
Theoretical analysis of a dual-probe scanning tunneling microscope setup on grapheneMikkel Settnes, Stephen R Power, Dirch H Petersen, et al.
The Review of Scientific Instruments|October 2, 2017
Breakthrough in current-in-plane tunneling measurement precision by application of multi-variable fitting algorithmAlberto Cagliani, Frederik W Østerberg, Ole Hansen, et al.
Beilstein Journal of Nanotechnology|August 18, 2018
A variable probe pitch micro-Hall effect methodMaria-Louise Witthøft, Frederik W Østerberg, Janusz Bogdanowicz, et al.
Nanotechnology|January 14, 2021
Effective electrical resistivity in a square array of oriented square inclusionsBenny Guralnik, Ole Hansen, Henrik H Henrichsen, et al.
Optics Express|December 25, 2015
Terahertz wafer-scale mobility mapping of graphene on insulating substrates without a gateJonas D Buron, David M A Mackenzie, Dirch H Petersen, et al.
Scientific Reports|July 25, 2015
Graphene mobility mappingJonas D Buron, Filippo Pizzocchero, Peter U Jepsen, et al.
The Review of Scientific Instruments|June 3, 2009
Accurate microfour-point probe sheet resistance measurements on small samplesSune Thorsteinsson, Fei Wang, Dirch H Petersen, et al.
Beilstein Journal of Nanotechnology|July 18, 2018
Electrical characterization of single nanometer-wide Si fins in dense arraysSteven Folkersma, Janusz Bogdanowicz, Andreas Schulze, et al.
Nanotechnology|March 14, 2020
Wafer-scale graphene quality assessment using micro four-point probe mappingDavid M A Mackenzie, Kristoffer G Kalhauge, Patrick R Whelan, et al.
Nano Letters|September 6, 2012
Graphene conductance uniformity mappingJonas D Buron, Dirch H Petersen, Peter Bøggild, et al.
Pageof 2