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Dmitry Veksler

Showing results (1-10 of 8) with videos related to

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IEEE Transactions on Electron Devices|January 30, 2018
Local field effect on charge-capture/emission dynamicsKin P Cheung, Dmitry Veksler, Jason P Campbell
Journal of Applied Physics|January 16, 2018
Microwave evaluation of electromigration susceptibility in advanced interconnectsChristopher E Sunday, Dmitry Veksler, Kin C Cheung, et al.
ECS Journal of Solid State Science and Technology : JSS|July 6, 2019
Microwave Monitoring of Atmospheric Corrosion of InterconnectsPapa K Amoah, Dmitry Veksler, Christopher E Sunday, et al.
IEEE Transactions on Electron Devices|June 13, 2024
Analysis and Control of RRAM Overshoot CurrentPragya R Shrestha, David M Nminibapiel, Jason P Campbell, et al.
Advanced Functional Materials|May 14, 2019
Ferroelectricity in Polar Polymer-based FETs: A Hysteresis AnalysisVasileia Georgiou, Dmitry Veksler, Jason P Campbell, et al.
Advanced Functional Materials|October 24, 2024
Highly Efficient Rapid Annealing of Thin Polar Polymer Film Ferroelectric Devices at Sub-Glass Transition TemperatureVasileia Georgiou, Dmitry Veksler, Jason T Ryan, et al.
IEEE Electron Device Letters : a Publication of the IEEE Electron Devices Society|September 12, 2017
Impact of RRAM Read Fluctuations on the Program-Verify ApproachDavid M Nminibapiel, Dmitry Veksler, J-H Kim, et al.
Nature Communications|March 15, 2024
Ultra-fast switching memristors based on two-dimensional materialsS S Teja Nibhanupudi, Anupam Roy, Dmitry Veksler, et al.
Pageof 1

Showing results (1-10 of 8) with videos related to

Sort By:
Pageof 1
IEEE Transactions on Electron Devices|January 30, 2018
Local field effect on charge-capture/emission dynamicsKin P Cheung, Dmitry Veksler, Jason P Campbell
Journal of Applied Physics|January 16, 2018
Microwave evaluation of electromigration susceptibility in advanced interconnectsChristopher E Sunday, Dmitry Veksler, Kin C Cheung, et al.
ECS Journal of Solid State Science and Technology : JSS|July 6, 2019
Microwave Monitoring of Atmospheric Corrosion of InterconnectsPapa K Amoah, Dmitry Veksler, Christopher E Sunday, et al.
IEEE Transactions on Electron Devices|June 13, 2024
Analysis and Control of RRAM Overshoot CurrentPragya R Shrestha, David M Nminibapiel, Jason P Campbell, et al.
Advanced Functional Materials|May 14, 2019
Ferroelectricity in Polar Polymer-based FETs: A Hysteresis AnalysisVasileia Georgiou, Dmitry Veksler, Jason P Campbell, et al.
Advanced Functional Materials|October 24, 2024
Highly Efficient Rapid Annealing of Thin Polar Polymer Film Ferroelectric Devices at Sub-Glass Transition TemperatureVasileia Georgiou, Dmitry Veksler, Jason T Ryan, et al.
IEEE Electron Device Letters : a Publication of the IEEE Electron Devices Society|September 12, 2017
Impact of RRAM Read Fluctuations on the Program-Verify ApproachDavid M Nminibapiel, Dmitry Veksler, J-H Kim, et al.
Nature Communications|March 15, 2024
Ultra-fast switching memristors based on two-dimensional materialsS S Teja Nibhanupudi, Anupam Roy, Dmitry Veksler, et al.
Pageof 1