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E D Palik

Showing results (1-10 of 8) with videos related to

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Applied Optics|January 9, 2010
A brief survey of magnetoopticsE D Palik
Applied Optics|February 23, 2010
Thin-film absorption coefficients by attenuated-total-reflection spectroscopyR T Holm, E D Palik
Applied Optics|January 9, 2010
A bibliography of magnetooptics of solidsE D Palik, B W Henvis
Applied Optics|October 22, 2010
Closed-form expressions to fit data obtained with a multipass Fabry-Perot interferometerH Boukari, E D Palik, R W Gammon
Applied Optics|November 12, 2010
Experimental study of the effect of surface defects on the finesse and contrast of a Fabry-Perot interferometerE D Palik, H Boukari, R W Gammon
Applied Optics|October 22, 2010
Line-shape studies for single- and triple-pass Fabry-Perot interferometer systemsE D Palik, H Boukari, R W Gammon
Applied Optics|April 17, 2010
Interference effects in luminescence studies of thin filmsR T Holm, S W McKnight, E D Palik, et al.
Applied Optics|March 4, 2010
Infrared characterization of surfaces and coatings by internal-reflection spectroscopyE D Palik, J W Gibson, R T Holm, et al.
Pageof 1

Showing results (1-10 of 8) with videos related to

Sort By:
Pageof 1
Applied Optics|January 9, 2010
A brief survey of magnetoopticsE D Palik
Applied Optics|February 23, 2010
Thin-film absorption coefficients by attenuated-total-reflection spectroscopyR T Holm, E D Palik
Applied Optics|January 9, 2010
A bibliography of magnetooptics of solidsE D Palik, B W Henvis
Applied Optics|October 22, 2010
Closed-form expressions to fit data obtained with a multipass Fabry-Perot interferometerH Boukari, E D Palik, R W Gammon
Applied Optics|November 12, 2010
Experimental study of the effect of surface defects on the finesse and contrast of a Fabry-Perot interferometerE D Palik, H Boukari, R W Gammon
Applied Optics|October 22, 2010
Line-shape studies for single- and triple-pass Fabry-Perot interferometer systemsE D Palik, H Boukari, R W Gammon
Applied Optics|April 17, 2010
Interference effects in luminescence studies of thin filmsR T Holm, S W McKnight, E D Palik, et al.
Applied Optics|March 4, 2010
Infrared characterization of surfaces and coatings by internal-reflection spectroscopyE D Palik, J W Gibson, R T Holm, et al.
Pageof 1