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Emmanuel Cadel

Showing results (1-10 of 7) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 16, 2007
Phase transformation and segregation to lattice defects in Ni-base superalloysDidier Blavette, Emmanuel Cadel, Cristelle Pareige, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 1, 2014
Simultaneous quantification of indium and nitrogen concentration in InGaNAs using HAADF-STEMTim Grieb, Knut Müller, Emmanuel Cadel, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 20, 2021
Development of an Energy-Sensitive Detector for the Atom Probe TomographyChristian Bacchi, Gérald Da Costa, Emmanuel Cadel, et al.
Nanoscale Research Letters|June 30, 2011
Atomic scale investigation of silicon nanowires and nanoclustersManuel Roussel, Wanghua Chen, Etienne Talbot, et al.
Nature Materials|January 7, 2015
Nanometre-scale evidence for interfacial dissolution-reprecipitation control of silicate glass corrosionRoland Hellmann, Stéphane Cotte, Emmanuel Cadel, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 15, 2026
Chromium- and Monolayer Graphene-Based Coating for THz-Assisted Atom Probe Tomography of Sol-Gel Silica SpecimensMatteo De Tullio, Florant Exertier, Ivan Blum, et al.
ACS Omega|August 11, 2025
Role of Defects in Atom Probe Analysis of Sol-Gel SilicaGustav Eriksson, Matteo De Tullio, Francesco Carnovale, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 16, 2007
Phase transformation and segregation to lattice defects in Ni-base superalloysDidier Blavette, Emmanuel Cadel, Cristelle Pareige, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 1, 2014
Simultaneous quantification of indium and nitrogen concentration in InGaNAs using HAADF-STEMTim Grieb, Knut Müller, Emmanuel Cadel, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 20, 2021
Development of an Energy-Sensitive Detector for the Atom Probe TomographyChristian Bacchi, Gérald Da Costa, Emmanuel Cadel, et al.
Nanoscale Research Letters|June 30, 2011
Atomic scale investigation of silicon nanowires and nanoclustersManuel Roussel, Wanghua Chen, Etienne Talbot, et al.
Nature Materials|January 7, 2015
Nanometre-scale evidence for interfacial dissolution-reprecipitation control of silicate glass corrosionRoland Hellmann, Stéphane Cotte, Emmanuel Cadel, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 15, 2026
Chromium- and Monolayer Graphene-Based Coating for THz-Assisted Atom Probe Tomography of Sol-Gel Silica SpecimensMatteo De Tullio, Florant Exertier, Ivan Blum, et al.
ACS Omega|August 11, 2025
Role of Defects in Atom Probe Analysis of Sol-Gel SilicaGustav Eriksson, Matteo De Tullio, Francesco Carnovale, et al.
Pageof 1