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Simultaneous quantification of indium and nitrogen concentration in InGaNAs using HAADF-STEM

Tim Grieb1, Knut Müller1, Emmanuel Cadel2

  • 11Institute of Solid State Physics,University of Bremen,Otto-Hahn-Allee 1,28359 Bremen,Germany.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|October 1, 2014
PubMed
Summary

Accurately measuring indium and nitrogen in InGaNAs requires combining strain and scattering data from high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM). This method reveals annealing effects, showing composition changes, not diffusion, influence emission shifts.

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