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Etienne Brodu
Aimo Winkelmann
Marc Seefeldt

Showing results (1-10 of 36) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 8, 2022
A Pattern Processing Method to Map Nanoscale Phases by EBSDEtienne Brodu, Aimo Winkelmann, Marc Seefeldt
Ultramicroscopy|June 28, 2008
Dynamical effects of anisotropic inelastic scattering in electron backscatter diffractionAimo Winkelmann
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 29, 2017
Depth Resolution Dependence on Sample Thickness and Incident Energy in On-Axis Transmission Kikuchi Diffraction in Scanning Electron Microscope (SEM)Etienne Brodu, Emmanuel Bouzy
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 6, 2018
A New and Unexpected Spatial Relationship Between Interaction Volume and Diffraction Pattern in Electron Microscopy in TransmissionEtienne Brodu, Emmanuel Bouzy
Physical Review Letters|March 17, 2011
Site-specific recoil diffraction of backscattered electrons in crystalsAimo Winkelmann, Maarten Vos
Ultramicroscopy|January 8, 2013
The role of localized recoil in the formation of Kikuchi patternsAimo Winkelmann, Maarten Vos
Ultramicroscopy|September 3, 2016
Two-dimensional Kikuchi patterns of Si as measured using an electrostatic analyserMaarten Vos, Aimo Winkelmann
Ultramicroscopy|December 17, 2009
Analysis of Kikuchi band contrast reversal in electron backscatter diffraction patterns of siliconAimo Winkelmann, Gert Nolze
Ultramicroscopy|December 2, 2014
Chirality determination of quartz crystals using electron backscatter diffractionAimo Winkelmann, Gert Nolze
Ultramicroscopy|November 12, 2003
Dynamical simulations of zone axis electron channelling patterns of cubic silicon carbideAimo Winkelmann, Bernd Schröter, Wolfgang Richter
Pageof 4

Showing results (1-10 of 36) with videos related to

Sort By:
Pageof 4
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 8, 2022
A Pattern Processing Method to Map Nanoscale Phases by EBSDEtienne Brodu, Aimo Winkelmann, Marc Seefeldt
Ultramicroscopy|June 28, 2008
Dynamical effects of anisotropic inelastic scattering in electron backscatter diffractionAimo Winkelmann
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 29, 2017
Depth Resolution Dependence on Sample Thickness and Incident Energy in On-Axis Transmission Kikuchi Diffraction in Scanning Electron Microscope (SEM)Etienne Brodu, Emmanuel Bouzy
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 6, 2018
A New and Unexpected Spatial Relationship Between Interaction Volume and Diffraction Pattern in Electron Microscopy in TransmissionEtienne Brodu, Emmanuel Bouzy
Physical Review Letters|March 17, 2011
Site-specific recoil diffraction of backscattered electrons in crystalsAimo Winkelmann, Maarten Vos
Ultramicroscopy|January 8, 2013
The role of localized recoil in the formation of Kikuchi patternsAimo Winkelmann, Maarten Vos
Ultramicroscopy|September 3, 2016
Two-dimensional Kikuchi patterns of Si as measured using an electrostatic analyserMaarten Vos, Aimo Winkelmann
Ultramicroscopy|December 17, 2009
Analysis of Kikuchi band contrast reversal in electron backscatter diffraction patterns of siliconAimo Winkelmann, Gert Nolze
Ultramicroscopy|December 2, 2014
Chirality determination of quartz crystals using electron backscatter diffractionAimo Winkelmann, Gert Nolze
Ultramicroscopy|November 12, 2003
Dynamical simulations of zone axis electron channelling patterns of cubic silicon carbideAimo Winkelmann, Bernd Schröter, Wolfgang Richter
Pageof 4