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F Bijkerk

Showing results (1-10 of 34) with videos related to

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Journal of Physics. Condensed Matter : an Institute of Physics Journal|December 24, 2011
Hydrogen-induced blistering mechanisms in thin film coatingsA S Kuznetsov, M A Gleeson, F Bijkerk
Optics Express|May 14, 2015
Wideband multilayer mirrors with minimal layer thicknesses variationI V Kozhevnikov, A E Yakshin, F Bijkerk
The Journal of Physical Chemistry. C, Nanomaterials and Interfaces|April 18, 2017
Adsorption and Dissociation of CO<sub>2</sub> on Ru(0001)M Pachecka, J M Sturm, C J Lee, et al.
The Review of Scientific Instruments|June 6, 2018
Self-contained in-vacuum in situ thin film stress measurement toolJ Reinink, R W E van de Kruijs, F Bijkerk
Journal of Nanoscience and Nanotechnology|October 18, 2018
Angular and Spectral Bandwidth of Extreme UV Multilayers Near Spacer Material Absorption EdgesA A Zameshin, A E Yakshin, A Chandrasekaran, et al.
Journal of Nanoscience and Nanotechnology|October 18, 2018
Grazing-Incidence La/B-Based Multilayer Mirrors for 6.<i>x</i> nm WavelengthD S Kuznetsov, A E Yakshin, J M Sturm, et al.
Optics Express|December 25, 2012
Modelling single shot damage thresholds of multilayer optics for high-intensity short-wavelength radiation sourcesR A Loch, R Sobierajski, E Louis, et al.
Optics Express|April 15, 2010
Properties of broadband depth-graded multilayer mirrors for EUV optical systemsA E Yakshin, I V Kozhevnikov, E Zoethout, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|June 7, 2017
Characterization of Self-Assembled Monolayers on a Ruthenium SurfaceA Shaheen, J M Sturm, R Ricciardi, et al.
The Review of Scientific Instruments|July 3, 2015
Photoluminescence-based detection of particle contamination on extreme ultraviolet reticlesA Gao, P J Rizo, L Scaccabarozzi, et al.
Pageof 4

Showing results (1-10 of 34) with videos related to

Sort By:
Pageof 4
Journal of Physics. Condensed Matter : an Institute of Physics Journal|December 24, 2011
Hydrogen-induced blistering mechanisms in thin film coatingsA S Kuznetsov, M A Gleeson, F Bijkerk
Optics Express|May 14, 2015
Wideband multilayer mirrors with minimal layer thicknesses variationI V Kozhevnikov, A E Yakshin, F Bijkerk
The Journal of Physical Chemistry. C, Nanomaterials and Interfaces|April 18, 2017
Adsorption and Dissociation of CO<sub>2</sub> on Ru(0001)M Pachecka, J M Sturm, C J Lee, et al.
The Review of Scientific Instruments|June 6, 2018
Self-contained in-vacuum in situ thin film stress measurement toolJ Reinink, R W E van de Kruijs, F Bijkerk
Journal of Nanoscience and Nanotechnology|October 18, 2018
Angular and Spectral Bandwidth of Extreme UV Multilayers Near Spacer Material Absorption EdgesA A Zameshin, A E Yakshin, A Chandrasekaran, et al.
Journal of Nanoscience and Nanotechnology|October 18, 2018
Grazing-Incidence La/B-Based Multilayer Mirrors for 6.<i>x</i> nm WavelengthD S Kuznetsov, A E Yakshin, J M Sturm, et al.
Optics Express|December 25, 2012
Modelling single shot damage thresholds of multilayer optics for high-intensity short-wavelength radiation sourcesR A Loch, R Sobierajski, E Louis, et al.
Optics Express|April 15, 2010
Properties of broadband depth-graded multilayer mirrors for EUV optical systemsA E Yakshin, I V Kozhevnikov, E Zoethout, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|June 7, 2017
Characterization of Self-Assembled Monolayers on a Ruthenium SurfaceA Shaheen, J M Sturm, R Ricciardi, et al.
The Review of Scientific Instruments|July 3, 2015
Photoluminescence-based detection of particle contamination on extreme ultraviolet reticlesA Gao, P J Rizo, L Scaccabarozzi, et al.
Pageof 4