Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

A semi-analytical approach for the characterization of ordered 3D nanostructures using grazing-incidence X-ray fluorescence.

Journal of synchrotron radiation·2020
Same author

Reflective aperiodic multilayer filters for metrology at XUV sources.

Optics express·2020
Same author

Grazing-incidence small-angle X-ray scattering study of correlated lateral density fluctuations in W/Si multilayers.

Acta crystallographica. Section A, Foundations and advances·2019
Same author

Grazing-Incidence La/B-Based Multilayer Mirrors for 6.<i>x</i> nm Wavelength.

Journal of nanoscience and nanotechnology·2018
Same author

Angular and Spectral Bandwidth of Extreme UV Multilayers Near Spacer Material Absorption Edges.

Journal of nanoscience and nanotechnology·2018
Same author

Specular reflection intensity modulated by grazing-incidence diffraction in a wide angular range.

Acta crystallographica. Section A, Foundations and advances·2018

Related Experiment Video

Updated: Apr 12, 2026

Simulation, Fabrication and Characterization of THz Metamaterial Absorbers
13:44

Simulation, Fabrication and Characterization of THz Metamaterial Absorbers

Published on: December 27, 2012

16.0K

Wideband multilayer mirrors with minimal layer thicknesses variation.

I V Kozhevnikov, A E Yakshin, F Bijkerk

    Optics Express
    |May 14, 2015
    PubMed
    Summary

    This study presents a new design for wideband multilayers, reducing layer thickness variations to improve reflectivity for hard X-ray to Extreme UV applications. The novel approach maintains optical performance without essential degradation.

    More Related Videos

    Author Spotlight: Fabrication of a Low-Cost, Fiber-Coupled, and Air-Spaced Fabry-P&#233;rot Etalon
    07:22

    Author Spotlight: Fabrication of a Low-Cost, Fiber-Coupled, and Air-Spaced Fabry-Pérot Etalon

    Published on: February 3, 2023

    8.7K
    Fabrication of Ultra-thin Color Films with Highly Absorbing Media Using Oblique Angle Deposition
    06:30

    Fabrication of Ultra-thin Color Films with Highly Absorbing Media Using Oblique Angle Deposition

    Published on: August 29, 2017

    8.9K

    Related Experiment Videos

    Last Updated: Apr 12, 2026

    Simulation, Fabrication and Characterization of THz Metamaterial Absorbers
    13:44

    Simulation, Fabrication and Characterization of THz Metamaterial Absorbers

    Published on: December 27, 2012

    16.0K
    Author Spotlight: Fabrication of a Low-Cost, Fiber-Coupled, and Air-Spaced Fabry-P&#233;rot Etalon
    07:22

    Author Spotlight: Fabrication of a Low-Cost, Fiber-Coupled, and Air-Spaced Fabry-Pérot Etalon

    Published on: February 3, 2023

    8.7K
    Fabrication of Ultra-thin Color Films with Highly Absorbing Media Using Oblique Angle Deposition
    06:30

    Fabrication of Ultra-thin Color Films with Highly Absorbing Media Using Oblique Angle Deposition

    Published on: August 29, 2017

    8.9K

    Area of Science:

    • Materials Science
    • Optics
    • Nanotechnology

    Background:

    • Wideband multilayers are crucial for applications spanning hard X-ray to Extreme Ultraviolet (EUV) spectral regions.
    • Traditional multilayer designs feature significant layer thickness variations with depth, impacting material properties like density and dielectric constant.
    • These variations lead to deviations from theoretical models and reduced reflectivity in fabricated multilayers.

    Purpose of the Study:

    • To address the challenge of layer thickness variations in wideband multilayers.
    • To develop novel multilayer designs that minimize thickness variations without compromising optical characteristics.
    • To enhance the reflectivity and performance of multilayers for hard X-ray and EUV applications.

    Main Methods:

    • Development of new design principles for wideband multilayers.
    • Focus on reducing layer thickness variations across the multilayer depth.
    • Modeling and simulation to verify optical performance and material property consistency.

    Main Results:

    • Successfully designed wideband multilayers with significantly reduced layer thickness variations.
    • Demonstrated that these designs maintain essential optical characteristics and reflectivity.
    • Overcame the limitations imposed by depth-dependent material property changes in thin films.

    Conclusions:

    • The proposed design strategy effectively mitigates the negative impact of layer thickness variations.
    • This advancement enables the fabrication of higher-performance wideband multilayers for advanced optical applications.
    • The findings contribute to improved X-ray and EUV optics by enhancing reflectivity and reliability.