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The Review of Scientific Instruments|April 2, 2024
A versatile setup for nanosecond laser polishing processes with in situ analysis capabilitiesF Brockner, D Lützenkirchen-HechtJournal of Synchrotron Radiation|June 19, 2009
Surface-sensitive reflection-mode EXAFS from layered sample systems: the influence of surface and interface roughnessP Keil, D Lützenkirchen-HechtJournal of Synchrotron Radiation|August 22, 2001
Reflection mode XAFS investigations of reactively sputtered thin filmsD Lützenkirchen-Hecht, R FrahmThe Review of Scientific Instruments|October 3, 2015
Quick scanning monochromator for millisecond in situ and in operando X-ray absorption spectroscopyO Müller, D Lützenkirchen-Hecht, R FrahmJournal of Synchrotron Radiation|August 7, 2001
Piezo-QEXAFS with fluorescence detection: fast time-resolved investigations of dilute specimensD Lützenkirchen-Hecht, S Grundmann, R FrahmThe Review of Scientific Instruments|August 7, 2010
A new flexible monochromator setup for quick scanning x-ray absorption spectroscopyJ Stötzel, D Lützenkirchen-Hecht, R FrahmThe Review of Scientific Instruments|April 3, 2015
Hard disk drive based microsecond X-ray chopper for characterization of ionization chambers and photodiodesO Müller, D Lützenkirchen-Hecht, R FrahmNanoscale|February 19, 2015
Microwave-assisted synthesis of water-soluble, fluorescent gold nanoclusters capped with small organic molecules and a revealing fluorescence and X-ray absorption studyC Helmbrecht, D Lützenkirchen-Hecht, W FrankJournal of Synchrotron Radiation|August 22, 2001
XAFS investigations of tin nitridesD Lützenkirchen-Hecht, N Scotti, H Jacobs, et al.Journal of Synchrotron Radiation|August 22, 2001
Piezo-QEXAFS: advances in time-resolved X-ray absorption spectroscopyM Richwin, R Zaeper, D Lützenkirchen-Hecht, et al.Pageof 3