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F Hosokawa

Showing results (1-10 of 3) with videos related to

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Physical Review Letters|May 9, 2015
Atomic-Resolution STEM Imaging of Graphene at Low Voltage of 30 kV with Resolution Enhancement by Using Large Convergence AngleH Sawada, T Sasaki, F Hosokawa, et al.
Ultramicroscopy|August 22, 2008
Measurement method of aberration from Ronchigram by autocorrelation functionH Sawada, T Sannomiya, F Hosokawa, et al.
Journal of Electron Microscopy|August 17, 2011
Electron microscopy at a sub-50 pm resolutionK Takayanagi, S Kim, S Lee, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Physical Review Letters|May 9, 2015
Atomic-Resolution STEM Imaging of Graphene at Low Voltage of 30 kV with Resolution Enhancement by Using Large Convergence AngleH Sawada, T Sasaki, F Hosokawa, et al.
Ultramicroscopy|August 22, 2008
Measurement method of aberration from Ronchigram by autocorrelation functionH Sawada, T Sannomiya, F Hosokawa, et al.
Journal of Electron Microscopy|August 17, 2011
Electron microscopy at a sub-50 pm resolutionK Takayanagi, S Kim, S Lee, et al.
Pageof 1