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F Laeri
T C Strand

Applied optics

Showing results (1-10 of 9) with videos related to

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Applied Optics|May 22, 2010
Angstrom resolution optical profilometry for microscopic objectsF Laeri, T C Strand
Applied Optics|March 25, 2010
Recording and reconstructing holograms in the spectrum of a white-light sourceF Heiniger, F Laeri, T Tschudi
Applied Optics|October 2, 2010
Aberration limits for annular Gaussian beams for optical storageT C Strand, H Werlich
Applied Optics|March 6, 2010
Optical pseudocolor encoding of spatial frequency informationJ Bescos, T C Strand
Applied Optics|May 22, 2010
Extended unambiguous range interferometryT C Strand, Y Katzir
Applied Optics|June 23, 2010
Profilometry with a coherence scanning microscopeB S Lee, T C Strand
Applied Optics|May 11, 2010
Nonlinear optical processing with halftones: accurate predictions for degradation and compensationA Armand, A A Sawchuk, T C Strand
Applied Optics|June 23, 2010
Three-dimensional microscopy: introduction by the feature editorsT C Strand, E W Hansen, B R Masters
Applied Optics|May 11, 2010
Laser diode feedback interferometer for stabilization and displacement measurementsT Yoshino, M Nara, S Mnatzakanian, et al.
Pageof 1

Showing results (1-10 of 9) with videos related to

Sort By:
Pageof 1
Applied Optics|May 22, 2010
Angstrom resolution optical profilometry for microscopic objectsF Laeri, T C Strand
Applied Optics|March 25, 2010
Recording and reconstructing holograms in the spectrum of a white-light sourceF Heiniger, F Laeri, T Tschudi
Applied Optics|October 2, 2010
Aberration limits for annular Gaussian beams for optical storageT C Strand, H Werlich
Applied Optics|March 6, 2010
Optical pseudocolor encoding of spatial frequency informationJ Bescos, T C Strand
Applied Optics|May 22, 2010
Extended unambiguous range interferometryT C Strand, Y Katzir
Applied Optics|June 23, 2010
Profilometry with a coherence scanning microscopeB S Lee, T C Strand
Applied Optics|May 11, 2010
Nonlinear optical processing with halftones: accurate predictions for degradation and compensationA Armand, A A Sawchuk, T C Strand
Applied Optics|June 23, 2010
Three-dimensional microscopy: introduction by the feature editorsT C Strand, E W Hansen, B R Masters
Applied Optics|May 11, 2010
Laser diode feedback interferometer for stabilization and displacement measurementsT Yoshino, M Nara, S Mnatzakanian, et al.
Pageof 1